scholarly journals A statistical model of secondary ion emission and attenuation clarifies disparities in quasi‐simultaneous arrival coefficients measured with secondary ion mass spectrometry

2020 ◽  
Vol 35 (1) ◽  
Author(s):  
Clive Jones ◽  
David A. Fike
Keyword(s):  
Mass Spectrometry ◽  
Statistical Model ◽  
Secondary Ion Mass Spectrometry ◽  
Secondary Ion Emission ◽  
Ion Mass Spectrometry ◽  
Ion Emission ◽  
Secondary Ion

Secondary ion mass spectrometry with C60+ and Au4004+ projectiles: Depth and nature of secondary ion emission from multilayer assemblies

2008 ◽  
Vol 269 (1-2) ◽  
pp. 112-117 ◽  
Author(s):  
Zhen Li ◽  
Stanislav V. Verkhoturov ◽  
Jay E. Locklear ◽  
Emile A. Schweikert
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Secondary Ion Emission ◽  
Ion Mass Spectrometry ◽  
Multilayer Assemblies ◽  
Ion Emission ◽  
Secondary Ion

Secondary ion emission from Langmuir-Blodgett (LB) films investigated by time-of-flight secondary ion mass spectrometry

1996 ◽  
Vol 100-101 ◽  
pp. 129-133 ◽  
Author(s):  
M. Kudo ◽  
S. Yamada ◽  
S. Yoshida ◽  
T. Watanabe ◽  
T. Hoshi
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Lb Films ◽  
Langmuir Blodgett ◽  
Secondary Ion Emission ◽  
Ion Mass Spectrometry ◽  
Ion Emission ◽  
Secondary Ion
Sign in / Sign up

Export Citation Format

Share Document