Quantitative evaluation of AES-depth profiles of thin anodic oxide films (Ta2O5/Ta, Nb2O5/Nb)
1983 ◽
Vol 5
(5)
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pp. 210-216
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1983 ◽
Vol 44
(C10)
◽
pp. C10-191-C10-194
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1995 ◽
Vol 25
(9)
◽
pp. 881-885
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