Quantitative evaluation of AES-depth profiles of thin anodic oxide films (Ta2O5/Ta, Nb2O5/Nb)

1983 ◽  
Vol 5 (5) ◽  
pp. 210-216 ◽  
Author(s):  
J. M. Sanz ◽  
S. Hofmann
1988 ◽  
Vol 28 (1) ◽  
pp. 43-56 ◽  
Author(s):  
J.S.L. Leach ◽  
B.R. Pearson

Author(s):  
M. Schneider ◽  
L. Šimůnková ◽  
A. Michaelis ◽  
M. Noeske ◽  
J. Aniol ◽  
...  

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