Thermal Effects in Silicon-Metal Interface Formation: A Photoemission Study of Si/Gd and Si/Yb

Author(s):  
L. Braicovich ◽  
E. Puppin
1999 ◽  
Vol 143 (1-4) ◽  
pp. 104-114 ◽  
Author(s):  
S. Sloboshanin ◽  
H. Engelhard ◽  
A. Goldmann ◽  
J.A. Schaefer

1993 ◽  
Vol 293 (1-2) ◽  
pp. 41-46 ◽  
Author(s):  
V.Di Castro ◽  
G. Polzonetti ◽  
S. Ciampi ◽  
G. Contini ◽  
O. Sakho

1989 ◽  
Vol 154 ◽  
Author(s):  
William C. Stewart ◽  
Jihperng Leu ◽  
Klavs F. Jensen

AbstractWe describe infrared and x-ray photoelectron spectroscopy studies of the interfaces formed when the PMDA/ODA polyamic acid is imidized on gold, chromium, and copper. Polyimide films ranging from 34 Å to 1328 Å are analyzed as part of these studies. The IR and XPS results indicate that the gold interacts very little with the polyimide, while copper produces significant changes in the IR and XPS spectra. At elevated cure temperatures passivated chromium also reacts with the polyimide. In structures with chromium and copper, the thermal stability of the polyimide at the interface is reduced from that of bulk polyimide. The data demonstrate that the metals interact with the polymer structure at the point where ring closure occurs to form the polyimide from polyarnic acid.


Vacuum ◽  
1988 ◽  
Vol 38 (4-5) ◽  
pp. 329-332 ◽  
Author(s):  
C Stephens ◽  
GJ Hughes ◽  
IT McGovern ◽  
AB McLean ◽  
DRT Zahn ◽  
...  

1989 ◽  
Vol 222 (1) ◽  
pp. A543
Author(s):  
R. Mamy ◽  
B. Carricaburu ◽  
A. Munoz-Yague ◽  
C. Fontaine

1989 ◽  
Vol 18 (1) ◽  
pp. 59-64 ◽  
Author(s):  
J. L. Shaw ◽  
R. E. Viturro ◽  
L. J. Brillson ◽  
D. Lagraffe

2005 ◽  
Vol 871 ◽  
Author(s):  
K. Demirkan ◽  
A. Mathew ◽  
R. L. Opila

AbstractAl was thermally evaporated onto the conjugated semiconductor polymer, poly(2-methoxy-5,2′- ethyl-hexyloxy-phenylene vinylene) (MEH-PPV) in successive steps. Interface formation and chemical interactions between the polymer and Al were investigated by X-ray Photoelectron Spectroscopy (XPS) and synchrotron source Ultraviolet Photoelectron Spectroscopy (UPS). XPS analyses (angle resolved and sputtering depth profile) proved the formation of an insulating aluminum oxide layer at the polymer metal interface. The C-O bonds in the polymer decreased as more Al was evaporated on the MEH-PPV. Also reaction between Al and the carbon backbone of the polymer leading to the creation of carbon-metal bonds was observed. UPS analysis suggested the possibility of Al reacting with the phenylene ring of the polymer.


1993 ◽  
Vol 293 (1-2) ◽  
pp. A630
Author(s):  
V. Di Castro ◽  
G. Polzonetti ◽  
S. Ciampi ◽  
G. Contini ◽  
O. Sakho

1987 ◽  
Vol 97-98 ◽  
pp. 851-854 ◽  
Author(s):  
L. Yang ◽  
B. Abeles ◽  
W. Eberhardt ◽  
D. Sondericker ◽  
H. Stasiewski ◽  
...  

1997 ◽  
Vol 55 (1) ◽  
pp. 389-396 ◽  
Author(s):  
Giancarlo Panaccione ◽  
Fausto Sirotti ◽  
Elisabetta Narducci ◽  
Giorgio Rossi

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