Relaxation of Energy and Polarization in the Resonant Secondary Emission Spectra of Semiconductors

1979 ◽  
pp. 215-227 ◽  
Author(s):  
A. Klochikhin ◽  
Ya. Morozenko ◽  
V. Travnikov ◽  
S. Permogorov
2015 ◽  
Vol 118 (1) ◽  
pp. 151-156 ◽  
Author(s):  
N. S. Vasil’ev ◽  
Il. S. Golyak ◽  
A. N. Morozov

1985 ◽  
Vol 131 (2) ◽  
pp. 615-620
Author(s):  
M. S. Brodin ◽  
I. V. Blonskii ◽  
A. O. Gushcha ◽  
V. V. Tishenko

1998 ◽  
Vol 52 (9) ◽  
pp. 1179-1189 ◽  
Author(s):  
J. A. Gardecki ◽  
M. Maroncelli

Technical spectra are reported for a series of six secondary emission standards based on the commercially available fluorophors: tryptophan, α-NPO, tetraphenylbutadiene, coumarin 153, DCM, and LDS 751. These spectra cover the wavelength range between 300 and 800 nm with significant spectral overlap and conform to the requirements of secondary emission standards. Standard emission spectra are determined by averaging the technical spectra obtained from three independently calibrated fluorescence spectrometers. A method for generating the wavelength-dependent correction file by using these standards is outlined. Comparison to the National Bureau of Standards (NBS)-reported quinine sulfate spectrum illustrates the accuracy of both the emission standards and the method of generating a complete emission correction file. With the use of the standards and method reported here, the accuracy of the emission correction is estimated to be better than 10% for the entire wavelength range and significantly better over the wavelength region of a typical spectrum.


2008 ◽  
Vol 105 (6) ◽  
pp. 919-923
Author(s):  
V. N. Moiseyenko ◽  
O. O. Guziy ◽  
V. S. Gorelik ◽  
M. P. Dergachov

Author(s):  
G. M. Greene ◽  
J. W. Sprys

The present study demonstrates that fracture surfaces appear strikingly different when observed in the transmission electron microscope by replication and in the scanning electron microscope by backscattering and secondary emission. It is important to know what form these differences take because of the limitations of each instrument. Replication is useful for study of surfaces too large for insertion into the S.E.M. and for resolution of fine detail at high magnification with the T.E.M. Scanning microscopy reduces sample preparation time and allows large sections of the actual surface to be viewed.In the present investigation various modes of the S.E.M. along with the transmission mode in the T.E.M. were used to study one area of a fatigue surface of a low carbon steel. Following transmission study of a platinum carbon replica in the T.E.M. and S.E.M. the replica was coated with a gold layer approximately 200A° in thickness to improve electron emission.


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