Femo Technique: A Milestone for Remote Operation and Maintenance

1986 ◽  
pp. 241-247
Author(s):  
H.-R. Oeser
Keyword(s):  
Operation And Maintenance ◽  
Remote Operation

Research on Remote Operation and Maintenance Technology of Substation Fault Recorder

2021 ◽  
Author(s):  
Renmin Zhang ◽  
Taibin Zhou ◽  
Guosong Lin ◽  
Jianyou Yang ◽  
Zhanglei Zhao
Keyword(s):  
Fault Recorder ◽  
Operation And Maintenance ◽  
Remote Operation

Time-delayed remote operation and maintenance of Space Station Freedom

1992 ◽  
Vol 28 ◽  
pp. 73-84
Author(s):  
David G. Hunter ◽  
Z.A.(Alex) Wojcik ◽  
David G. Cooke
Keyword(s):  
Space Station ◽  
Operation And Maintenance ◽  
Remote Operation ◽  
Space Station Freedom

Enabling cybersecurity features using a layered connectivity to promote secure remote operation and maintenance

2021 ◽  
Author(s):  
D. T. Dantas ◽  
K. T. Fouwels ◽  
H. Li ◽  
T. Charton ◽  
L. Chen
Keyword(s):  
Operation And Maintenance ◽  
Remote Operation

Design of an intermediate high voltage EM for 3-D studies of biological material and its integration with a system for remote access

1995 ◽  
Vol 53 ◽  
pp. 66-67 ◽  
Author(s):  
Mark H. Ellisman
Keyword(s):  
High Voltage ◽  
High Performance ◽  
Remote Access ◽  
3 Dimensional ◽  
Voltage Electron ◽  
Remote Operation ◽  
High Voltage Electron Microscope ◽  
La Jolla ◽  
Performance Computing ◽  
Advanced Version

The increased availability of High Performance Computing and Communications (HPCC) offers scientists and students the potential for effective remote interactive use of centralized, specialized, and expensive instrumentation and computers. Examples of instruments capable of remote operation that may be usefully controlled from a distance are increasing. Some in current use include telescopes, networks of remote geophysical sensing devices and more recently, the intermediate high voltage electron microscope developed at the San Diego Microscopy and Imaging Resource (SDMIR) in La Jolla. In this presentation the imaging capabilities of a specially designed JEOL 4000EX IVEM will be described. This instrument was developed mainly to facilitate the extraction of 3-dimensional information from thick sections. In addition, progress will be described on a project now underway to develop a more advanced version of the Telemicroscopy software we previously demonstrated as a tool to for providing remote access to this IVEM (Mercurio et al., 1992; Fan et al., 1992).

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