Applications of The Mössbauer Effect to The Characterization of Materials

1991 ◽  
pp. 119-151
Author(s):  
Gary J. Long ◽  
Fernande Grandjean
Keyword(s):  
Mössbauer Effect ◽  
Mossbauer Effect ◽  
Characterization Of Materials

scholarly journals Characterization of Ag-Ge-Se bulk glasses by means of Mössbauer effect on57Fe and119Sn atomic nuclei

2010 ◽  
Vol 217 ◽  
pp. 012073
Author(s):  
B Arcondo ◽  
M A Ureña ◽  
J M Conde Garrido ◽  
J A Rocca ◽  
M Fontana
Keyword(s):  
Mössbauer Effect ◽  
Mossbauer Effect ◽  
Atomic Nuclei ◽  
Bulk Glasses

Characterization of Supported Gold Catalysts with 197Au Mössbauer Effect Spectroscopy

2002 ◽  
pp. 59-66
Author(s):  
A. Goossens ◽  
M. W. J. CRAJÉ ◽  
A. M. Van Der Kraan ◽  
A. Zwijnenburg ◽  
M. Makkee ◽  
...  
Keyword(s):  
Mössbauer Effect ◽  
Gold Catalysts ◽  
Mossbauer Effect ◽  
Supported Gold Catalysts ◽  
Mössbauer Effect Spectroscopy ◽  
Supported Gold

Application of the Mössbauer effect to the characterization of an amorphous tin-oxide system

1979 ◽  
Vol 19 (3) ◽  
pp. 1369-1373 ◽  
Author(s):  
G. S. Collins ◽  
T. Kachnowski ◽  
N. Benczer-Koller ◽  
M. Pasternak
Keyword(s):  
Tin Oxide ◽  
Mössbauer Effect ◽  
Oxide System ◽  
Mossbauer Effect

Mössbauer effect characterization of Brazilian iron ores for mining industrial purposes

1993 ◽  
Vol 76 (1-4) ◽  
pp. 244-245 ◽  
Author(s):  
M.I. da Costa ◽  
J.I. Kunrath ◽  
J.B.M. da Cunha ◽  
J.T. Moro ◽  
J.H. de Araújo
Keyword(s):  
Mössbauer Effect ◽  
Iron Ores ◽  
Mossbauer Effect

Mössbauer effect characterization of some Brazilian iron ores

1994 ◽  
Vol 83 (1) ◽  
pp. 463-467
Author(s):  
Moacir I. da Costa ◽  
José I. Kunrath ◽  
João B. M. da Cunha ◽  
José T. Moro ◽  
José H. de Araújo
Keyword(s):  
Mössbauer Effect ◽  
Iron Ores ◽  
Mossbauer Effect

Mössbauer Effect Characterization of Silica Supported Rhodium-Iron Catalysts

1986 ◽  
pp. 635-647 ◽  
Author(s):  
Yoshitaka Minai ◽  
Takeshi Tominaga ◽  
Takakazu Fukushima ◽  
Masaru Ichikawa
Keyword(s):  
Mössbauer Effect ◽  
Iron Catalysts ◽  
Mossbauer Effect

Some applications of electron beam microanalysis techniques in VLSI process evaluation

1983 ◽  
Vol 41 ◽  
pp. 160-161
Author(s):  
Simon Thomas
Keyword(s):  
Integrated Circuits ◽  
Process Evaluation ◽  
Large Scale ◽  
Technology Development ◽  
Analytical Techniques ◽  
Successful Implementation ◽  
Analysis Of Failures ◽  
Characterization Of Materials ◽  
Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

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