Low-Temperature Epitaxial Growth of Thin Metal Films: In Situ Electrical Resistivity Study

Author(s):  
M. Jalochowski ◽  
M. Hoffmann ◽  
E. Bauer
1976 ◽  
Vol 32 (2) ◽  
pp. 185-190 ◽  
Author(s):  
K. Yagi ◽  
K. Takayanagi ◽  
K. Kobayashi ◽  
G. Honjo

1990 ◽  
Vol 41 (8) ◽  
pp. 5410-5413 ◽  
Author(s):  
J. W. Evans ◽  
D. E. Sanders ◽  
P. A. Thiel ◽  
Andrew E. DePristo

1967 ◽  
Vol 38 (4) ◽  
pp. 1986-1987 ◽  
Author(s):  
D. I. Kennedy ◽  
R. E. Hayes ◽  
R. W. Alsford

2020 ◽  
Vol 167 (11) ◽  
pp. 112505
Author(s):  
T. Wiegmann ◽  
J. Drnec ◽  
F. Reikowski ◽  
J. Stettner ◽  
F. Maroun ◽  
...  

1985 ◽  
Vol 48 ◽  
Author(s):  
J. Bloch ◽  
M. Heiblum

ABSTRACTNolybenum and tungsten metals have been grown on an MBE grown (100)GaAs at various substrate temperatures. RHEED technique was used in situ to analyse the crystalline structure and the growth mechanism of the mechanism of the thin metal films. It was found that Mo epilayers can be grown on the (100) GaAs at temperatures between 150–400°C. The epitaxal arrangement is (111)Mo || (100)GaAs with [011]Mo || [011] GaAs. Tungsten films are not growing epitaxially under similar experimental conditions.


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