Raman Scattering Characterization of Strain in (001) and (111) GaSb/AlSb Single Quantum Wells and Superlattices and in Metastable GexSn1-x Alloys

Author(s):  
G. P. Schwartz
1984 ◽  
Vol 68 (1) ◽  
pp. 398-405 ◽  
Author(s):  
R.D. Dupuis ◽  
R.C. Miller ◽  
P.M. Petroff

1993 ◽  
Vol 127 (1-4) ◽  
pp. 411-415 ◽  
Author(s):  
F. Schäffler ◽  
M. Wachter ◽  
H.-J. Herzog ◽  
K. Thonke ◽  
R. Sauer
Keyword(s):  

2004 ◽  
Vol 70 (15) ◽  
Author(s):  
Takeya Unuma ◽  
Kensuke Kobayashi ◽  
Aishi Yamamoto ◽  
Masahiro Yoshita ◽  
Yoshiaki Hashimoto ◽  
...  

2000 ◽  
Vol 7 (3-4) ◽  
pp. 576-580 ◽  
Author(s):  
J.H Chang ◽  
M.W Cho ◽  
S.K Hong ◽  
K Godo ◽  
H Makino ◽  
...  
Keyword(s):  

1997 ◽  
Vol 468 ◽  
Author(s):  
D. Behr ◽  
R. Niebuhr ◽  
H. Obloh ◽  
J. Wagner ◽  
K. H. Bachem ◽  
...  

ABSTRACTWe report on resonant Raman scattering in Al0.15Ga0.85N/GaN single quantum wells (QWs) and AlxGa1-xN/GaN/lnyGa1-yN heterostructures. By choosing appropriate excitation conditions we could probe selectively the GaN quantum well or the Al0.15Ga0.85N barrier of Al0.15Ga0.85N/GaN single quantum wells. For the InxGa1-xN material system a linear frequency shift of the E2- and A1(LO) phonon mode to lower frequencies was found with increasing In content. The shift was determined to -0.79cm-1 per % In content for the A,(LO) phonon frequency. Resonant excitation of AlxGa1-xN/GaN/InyGa1-YN heterostructures enabled us to detect phonon signals from the InxGa1-xN layer in the heterostructure and to determine its In content.


1997 ◽  
Vol 55 (24) ◽  
pp. 16376-16384 ◽  
Author(s):  
R. Meyer ◽  
M. Dahl ◽  
G. Schaack ◽  
A. Waag

1992 ◽  
Vol 71 (10) ◽  
pp. 5263-5265 ◽  
Author(s):  
R. Hey ◽  
M. Höricke ◽  
A. Frey ◽  
V. Egorov ◽  
P. Krispin ◽  
...  

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