Alternative Approaches to Nerve Sparing: Techniques and Outcomes

2008 ◽  
pp. 123-130
Author(s):  
Can Öbek ◽  
Ali Rýza Kural
Author(s):  
J.M. Cowley

By extrapolation of past experience, it would seem that the future of ultra-high resolution electron microscopy rests with the advances of electron optical engineering that are improving the instrumental stability of high voltage microscopes to achieve the theoretical resolutions of 1Å or better at 1MeV or higher energies. While these high voltage instruments will undoubtedly produce valuable results on chosen specimens, their general applicability has been questioned on the basis of the excessive radiation damage effects which may significantly modify the detailed structures of crystal defects within even the most radiation resistant materials in a period of a few seconds. Other considerations such as those of cost and convenience of use add to the inducement to consider seriously the possibilities for alternative approaches to the achievement of comparable resolutions.


2007 ◽  
Vol 177 (4S) ◽  
pp. 386-387
Author(s):  
Andreas Bannowsky ◽  
Heiko Schulze ◽  
Christof van der Horst ◽  
Stefan Hautmann ◽  
Klaus P. Juenemann

2007 ◽  
Vol 177 (4S) ◽  
pp. 6-6
Author(s):  
Jason L. Nelles ◽  
Stephen J. Freedland ◽  
Joseph C. Presti ◽  
Martha K. Terris ◽  
William J. Aronson ◽  
...  

2007 ◽  
Vol 177 (4S) ◽  
pp. 508-509
Author(s):  
Troy R. Gianduzzo ◽  
Jose R. Colombo ◽  
Georges-Pascal Haber ◽  
Kester Nahen ◽  
Cristina Magi-Galluzzi ◽  
...  

2006 ◽  
Vol 175 (4S) ◽  
pp. 107-107
Author(s):  
Georges Fournier ◽  
Antoine Valeri ◽  
Adham Rammal ◽  
Vincent Joulin ◽  
Luc Cormier ◽  
...  

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