Local Morphological Measures Confirm that Folding Within Small Partitions of the Human Cortex Follows Universal Scaling Law

A noisy Gaussian channel is defined as a channel in which an input field mode is subjected to random Gaussian displacements in phase space. We introduce the quantum fidelity of a Gaussian channel for pure and mixed input states, and we derive a universal scaling law of the fidelity for pure initial states. We also find the maximum fidelity of a Gaussian channel over all input states. Quantum cloning and continuous-variable teleportation are presented as physical examples of Gaussian channels to which the fidelity results can be applied.

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addendum: A universal scaling law for atomic diffusion in condensed matter

Nature ◽

10.1038/35079655 ◽

2001 ◽

Vol 411 (6838) ◽

pp. 720-720 ◽

Cited By ~ 6

Author(s):

M. Dzugutov

Keyword(s):

Condensed Matter ◽

Scaling Law ◽

Atomic Diffusion ◽

Universal Scaling

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Configurational Relaxation of the D Defect in Hydrogenated Amorphous Silicon as a Function of Fermi Energy

MRS Proceedings ◽

10.1557/proc-258-211 ◽

1992 ◽

Vol 258 ◽

Author(s):

Thomas M. Leen ◽

Randall J. Rasmussen ◽

J. David Cohen

Keyword(s):

Amorphous Silicon ◽

Fermi Energy ◽

Thermal Emission ◽

Scaling Law ◽

Hydrogenated Amorphous Silicon ◽

Dangling Bond ◽

Universal Scaling ◽

Depletion Width ◽

Hydrogenated Amorphous ◽

Optical Evidence

ABSTRACTBy using light soaking and partial dark annealing to vary the Fermi level in n-type a-Si:H, we have examined the thermal emission of electrons from the dangling bond (D) defect. We find optical evidence for a change in the configuration of the D defect when EF = Ec-0.55±0.08eV. We find that the relaxation rate increases with temperature and increases as EF is brought closer to Ec. Voltage-pulse photocapacitance and depletion-width-modulated ESR show emission is predominantly from D° defects for short emission times and short filling pulse widths. With longer emission times and longer filling pulse widths, emission from D-dominates. We also find that the charge emission transient fits a universal scaling law under a variety of pulsing conditions, temperatures, and anneal states.

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