Qualifying Dependent Failure Analysis Within ISO26262: Applicability to Semiconductors

Author(s):  
Alison Young ◽  
Alastair Walker
1993 ◽  
Vol 142 (2-3) ◽  
pp. 137-153 ◽  
Author(s):  
Susan E. Cooper ◽  
Ernest V. Lofgren ◽  
Pranab K. Samanta ◽  
See-Meng Wong

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