Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes
2019 ◽
Vol 62
(4)
◽
pp. 578-581
2000 ◽
Vol 69-70
◽
pp. 289-294
◽
Keyword(s):
Keyword(s):
Keyword(s):