Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and Technology
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Published By Springer Berlin Heidelberg

9783642035340, 9783642035357

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Mechanical Properties of One-Dimensional Nanostructures

Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and Technology ◽

10.1007/978-3-642-03535-7_16 ◽

2009 ◽

pp. 571-611 ◽

Cited By ~ 2

Author(s):

Gheorghe Stan ◽

Robert F. Cook

Keyword(s):

Mechanical Properties ◽

One Dimensional ◽

One Dimensional Nanostructures

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Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale

Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and Technology ◽

10.1007/978-3-642-03535-7_17 ◽

2009 ◽

pp. 613-646

Author(s):

Patrick Fiorenza ◽

Raffaella Lo Nigro ◽

Vito Raineri

Keyword(s):

Heterogeneous Materials ◽

Submicron Scale ◽

Local Measurements ◽

Colossal Permittivity

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Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM

Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and Technology ◽

10.1007/978-3-642-03535-7_11 ◽

2009 ◽

pp. 363-393 ◽

Cited By ~ 1

Author(s):

Noël M. Ziebarth ◽

Felix Rico ◽

Vincent T. Moy

Keyword(s):

Ocular Tissues

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Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter

Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and Technology ◽

10.1007/978-3-642-03535-7_7 ◽

2009 ◽

pp. 199-223

Author(s):

Davide Tranchida ◽

Stefano Piccarolo

Keyword(s):

Atomic Force Microscopy ◽

Soft Matter ◽

Mechanical Characterization ◽

Nanometer Scale ◽

Depth Sensing ◽

Force Microscopy ◽

Atomic Force

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Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices

Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and Technology ◽

10.1007/978-3-642-03535-7_13 ◽

2009 ◽

pp. 425-486

Author(s):

F. Consolo ◽

F. Mastrangelo ◽

G. Ciardelli ◽

F. M. Montevecchi ◽

U. Morbiducci ◽

...

Keyword(s):

Modelling Techniques

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Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope

Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and Technology ◽

10.1007/978-3-642-03535-7_8 ◽

2009 ◽

pp. 225-257 ◽

Cited By ~ 1

Author(s):

Yin Zhang ◽

Kevin D Murphy

Keyword(s):

Atomic Force Microscope ◽

Structural Modeling ◽

Atomic Force ◽

Modeling Analysis

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Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes

Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and Technology ◽

10.1007/978-3-642-03535-7_4 ◽

2009 ◽

pp. 89-128 ◽

Cited By ~ 19

Author(s):

Thierry Mélin ◽

Mariusz Zdrojek ◽

David Brunel

Keyword(s):

Carbon Nanotubes ◽

Electronic Properties ◽

Electrostatic Force ◽

Electrostatic Force Microscopy ◽

Force Microscopy

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Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy

Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and Technology ◽

10.1007/978-3-642-03535-7_9 ◽

2009 ◽

pp. 259-321

Author(s):

Martin Munz

Keyword(s):

Atomic Force Microscopy ◽

Experimental Methods ◽

Force Microscopy ◽

Atomic Force ◽

Lateral Forces

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Polarization-Sensitive Tip-Enhanced Raman Scattering

Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and Technology ◽

10.1007/978-3-642-03535-7_3 ◽

2009 ◽

pp. 57-88 ◽

Cited By ~ 2

Author(s):

Pietro Giuseppe Gucciardi ◽

Marc Lamy de La Chapelle ◽

Jean-Christophe Valmalette ◽

Gennaro Picardi ◽

Razvigor Ossikovski

Keyword(s):

Raman Scattering ◽

Enhanced Raman Scattering

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Scanning Probe Microscopy as a Tool Applied to Agriculture

Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and Technology ◽

10.1007/978-3-642-03535-7_26 ◽

2009 ◽

pp. 915-944

Author(s):

Fabio Lima Leite ◽

Alexandra Manzoli ◽

Paulo Sérgio Paula de Herrmann ◽

Osvaldo Novais Oliveira ◽

Luiz Henrique Capparelli Mattoso

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and TechnologyLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Mechanical Properties of One-Dimensional Nanostructures

Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale

Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM

Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter

Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices

Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope

Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes

Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy

Polarization-Sensitive Tip-Enhanced Raman Scattering

Scanning Probe Microscopy as a Tool Applied to Agriculture

Scanning Probe Microscopy in Nanoscience and Nanotechnology - NanoScience and Technology
Latest Publications