A Survey of Feature Location Techniques

Optical sensors for alignment, distance measurement, and feature location in automated manufacturing operations

International Congress on Applications of Lasers & Electro-Optics ◽

10.2351/1.5058049 ◽

1988 ◽

Author(s):

Warren H. Stevenson

Keyword(s):

Optical Sensors ◽

Distance Measurement ◽

Automated Manufacturing ◽

Feature Location ◽

Manufacturing Operations

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A Hybrid Feature Location Technique for Re-engineeringSingle Systems into Software Product Lines

15th International Working Conference on Variability Modelling of Software-Intensive Systems ◽

10.1145/3442391.3442403 ◽

2021 ◽

Author(s):

Gabriela K. Michelon ◽

Lukas Linsbauer ◽

Wesley K.G. Assunção ◽

Stefan Fischer ◽

Alexander Egyed

Keyword(s):

Software Product Lines ◽

Feature Location ◽

Product Lines ◽

Software Product

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Correction to: An empirical assessment of baseline feature location techniques

Empirical Software Engineering ◽

10.1007/s10664-020-09924-6 ◽

2021 ◽

Vol 26 (3) ◽

Author(s):

Abdul Razzaq ◽

Andrew Le Gear ◽

Chris Exton ◽

Jim Buckley

Keyword(s):

Feature Location ◽

Empirical Assessment ◽

Link Type

A Correction to this paper has been published: 10.1007/s10664-020-09924-6

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Handling nonconforming individuals in search-based model-driven engineering: nine generic strategies for feature location in the modeling space of the meta-object facility

Software & Systems Modeling ◽

10.1007/s10270-021-00870-5 ◽

2021 ◽

Author(s):

Jaime Font ◽

Lorena Arcega ◽

Øystein Haugen ◽

Carlos Cetina

Keyword(s):

Model Driven Engineering ◽

Feature Location ◽

Model Driven ◽

Meta Object Facility ◽

Generic Strategies

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Feature Location Using Probabilistic Ranking of Methods Based on Execution Scenarios and Information Retrieval

IEEE Transactions on Software Engineering ◽

10.1109/tse.2007.1016 ◽

2007 ◽

Vol 33 (6) ◽

pp. 420-432 ◽

Cited By ~ 261

Author(s):

Denys Poshyvanyk ◽

Yann-Gael Gueheneuc ◽

Andrian Marcus ◽

Giuliano Antoniol ◽

Vaclav Rajlich

Keyword(s):

Information Retrieval ◽

Feature Location

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Facial feature location using multilayer perceptrons and micro-features

[Proceedings] 1991 IEEE International Joint Conference on Neural Networks ◽

10.1109/ijcnn.1991.170418 ◽

1991 ◽

Cited By ~ 1

Author(s):

J. Waite

Keyword(s):

Facial Feature ◽

Multilayer Perceptrons ◽

Feature Location ◽

Micro Features

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AN EFFICIENT APPROACH FOR FACE DETECTION AND FACIAL FEATURE LOCATION USING PRUNE-AND-SEARCH TECHNIQUE

International Journal of Pattern Recognition and Artificial Intelligence ◽

10.1142/s0218001404003551 ◽

2004 ◽

Vol 18 (06) ◽

pp. 987-1005 ◽

Cited By ~ 2

Author(s):

CHIN-CHEN CHANG ◽

YUAN-HUI YU

Keyword(s):

Face Detection ◽

Facial Feature ◽

Facial Features ◽

Base Line ◽

Human Face ◽

Feature Location ◽

Search Technique ◽

Efficient Approach ◽

Human Face Detection ◽

Geometric Knowledge

This paper proposes an efficient approach for human face detection and exact facial features location in a head-and-shoulder image. This method searches for the eye pair candidate as a base line by using the characteristic of the high intensity contrast between the iris and the sclera. To discover other facial features, the algorithm uses geometric knowledge of the human face based on the obtained eye pair candidate. The human face is finally verified with these unclosed facial features. Due to the merits of applying the Prune-and-Search and simple filtering techniques, we have shown that the proposed method indeed achieves very promising performance of face detection and facial feature location.

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