Investigation of local chemical and electronic properties of small particles with EELS point analysis and image energy filtering in a STEM

1989 ◽  
pp. 333-339
Author(s):  
D. Ugarte ◽  
C. Colliex
Keyword(s):  
Electronic Properties ◽  
Small Particles ◽  
Energy Filtering ◽  
Point Analysis

Electronic Properties of Small Particles

1984 ◽  
Vol 14 (1) ◽  
pp. 49-66 ◽  
Author(s):  
R Kubo ◽  
A Kawabata ◽  
S Kobayashi
Keyword(s):  
Electronic Properties ◽  
Small Particles

THE KUBO EFFECTS IN SMALL PARTICLES OF METALS

1996 ◽  
Vol 03 (01) ◽  
pp. 3-7 ◽  
Author(s):  
SHUN-ICHI KOBAYASHI
Keyword(s):  
Electronic Properties ◽  
Metal Particles ◽  
Small Particles ◽  
Mesoscopic Systems ◽  
Level Statistics ◽  
Theoretical Paper ◽  
Charging Energy ◽  
Level Quantization ◽  
Nmr Properties ◽  
Small Metal Particles

This talk is to commemorate Kubo’s pioneering theoretical paper in 1962 on the electronic properties of very small metal particles. We discuss mainly the NMR properties of the particles. Emphasis is placed on factors such as the level quantization, the level statistics, the finiteness of systems, and the single electron charging energy, which are current topics in the field of mesoscopic systems.

Electronic properties of metallic small particles

1990 ◽  
Vol 24-26 (2) ◽  
pp. 463-492 ◽  
Author(s):  
S.-I. Kobayashi
Keyword(s):  
Electronic Properties ◽  
Small Particles

STEM characterization of supported catalyst clusters

1990 ◽  
Vol 48 (4) ◽  
pp. 294-295
Author(s):  
J. Liu ◽  
G. E. Spinnler ◽  
M. Pan ◽  
J. M. Cowley
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Number ◽  
Supported Catalyst ◽  
Dark Field ◽  
High Angle ◽  
Small Particles ◽  
Energy Filtering ◽  
Transmission Electron ◽  
Scanning Transmission

Scanning transmission electron microscopy (STEM) offers a powerful extension to the conventional transmission electron microscopy (TEM) by combining high resolution microanalysis with a variety of imaging and diffraction modes. Bright-field (BF) and dark-field STEM imaging (with or without energy filtering) can be used to obtain structural images or to locate small particles and other inhomogeneous sample areas for microanalysis. The microdiffraction technique can provide crystallographic information on nanometer-scale small particles. Secondary electron (SE) images with a resolution approaching the probe size (0.5 nm) can be obtained in STEM instruments, providing topographic information on the samples studied. High-angle annular dark field (HAADF) imaging is also available in dedicated STEM instruments. The intensity of high-angle scattered electrons depends strongly on the atomic number (Z). This unique property makes the HAADF imaging a powerful microscopic technique in characterizing supported catalyst systems which often comprize high atomic number particles supported on low atomic number substrates.

Thermodynamic Lattice and Electronic Properties of Small Particles

1973 ◽  
Vol 8 (9) ◽  
pp. 4186-4199 ◽  
Author(s):  
V. Novotny ◽  
P. P. M. Meincke
Keyword(s):  
Electronic Properties ◽  
Small Particles

Drift-Corrected High Magnification Elemental X-Ray Mappng

2000 ◽  
Vol 6 (S2) ◽  
pp. 418-419
Author(s):  
M. Kawasaki ◽  
F. Hosokawa ◽  
G. Fritz ◽  
N. Kale
Keyword(s):  
Local Analysis ◽  
X Rays ◽  
Chemical Mapping ◽  
Materials Properties ◽  
X Ray ◽  
Energy Filtering ◽  
Area Of Interest ◽  
Point Analysis ◽  
Higher Dimensional ◽  
Chemical Distribution

Chemical analysis in a TEM has usually been done as a manual point analysis by forming a probe of an appropriate size for the area of interest. This type of local analysis may provide enough information from the selected area, but these days when materials properties are found to be deeply dependent on chemical distribution, one needs to do a higher dimensional analysis using a systematic line scan or mapping.Since the advent of the Field Emission Gun (FEG), chemical mapping using X-rays (EDS mapping) or inelastic scattered electrons (Energy Filtering mapping) has become more and more commonly used due to the extremely high resolution information available in the chemical map. Compared to the energy filtered mapping, EDS maps take longer to acquire due to the use of the scanned probe over the area but EDS mapping allows a wider choice of elements to map due to the wider energy range it covers.

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