The Use of Multi-Pass Time-of-Flight Mass Analyzers for Nuclear-Decay Spectroscopy of Mass Identified Nuclei

2001 ◽  
pp. 439-442
Author(s):  
H. Wollnik ◽  
A. Casares
Keyword(s):  
Time Of Flight ◽  
Nuclear Decay ◽  
Decay Spectroscopy

scholarly journals Combined high-resolution laser spectroscopy and nuclear decay spectroscopy for the study of the low-lying states inFr206,At202, andBi198

2016 ◽  
Vol 93 (1) ◽  
Author(s):  
K. M. Lynch ◽  
T. E. Cocolios ◽  
J. Billowes ◽  
M. L. Bissell ◽  
I. Budinčević ◽  
...  
Keyword(s):  
High Resolution ◽  
Laser Spectroscopy ◽  
Nuclear Decay ◽  
Decay Spectroscopy

scholarly journals Laser-assisted nuclear decay spectroscopy of Au176,177,179

2021 ◽  
Vol 104 (2) ◽  
Author(s):  
R. D. Harding ◽  
A. N. Andreyev ◽  
A. E. Barzakh ◽  
J. G. Cubiss ◽  
P. Van Duppen ◽  
...  
Keyword(s):  
Nuclear Decay ◽  
Decay Spectroscopy

Electron time-of-flight: A new tool in β -decay spectroscopy

2018 ◽  
Vol 97 (3) ◽  
Author(s):  
C. Roick ◽  
D. Dubbers ◽  
B. Märkisch ◽  
H. Saul ◽  
U. Schmidt
Keyword(s):  
Time Of Flight ◽  
Β Decay ◽  
Decay Spectroscopy

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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