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A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI
Journal of Electronic Testing
◽
10.1007/bf00137568
◽
1996
◽
Vol 9
(1-2)
◽
pp. 109-115
◽
Cited By ~ 5
Author(s):
Johan Verfaillie
◽
Didier Haspeslagh
Keyword(s):
General Purpose
◽
Design For Test
◽
Mixed Signal
◽
Test Methodology
Download Full-text
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Cited By
References
Design for Test Approaches to Mixed-Signal Testing
Proceedings International Test Conference 1992
◽
10.1109/test.1992.527874
◽
2005
◽
Cited By ~ 9
Author(s):
M. Jarwala
Keyword(s):
Design For Test
◽
Mixed Signal
◽
Mixed Signal Testing
Download Full-text
Towards a general purpose mixed-signal instrumentation layer in the die stack of a 3D-SIC
2014 19th IEEE European Test Symposium (ETS)
◽
10.1109/ets.2014.6847832
◽
2014
◽
Cited By ~ 1
Author(s):
Shudong Lin
◽
Gordon W. Roberts
Keyword(s):
General Purpose
◽
Mixed Signal
Download Full-text
Extending Design-for-Test Into the Analog and Mixed-Signal Domains
AT&T Technical Journal
◽
10.1002/j.1538-7305.1994.tb00578.x
◽
1994
◽
Vol 73
(2)
◽
pp. 49-55
◽
Cited By ~ 3
Author(s):
Philip V. Lopresti
Keyword(s):
Design For Test
◽
Mixed Signal
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Mixed-signal SoC testing: is mixed-signal design-for-test on its way?
Proceedings of the Ninth Asian Test Symposium
◽
10.1109/ats.2000.893595
◽
2005
◽
Author(s):
Chin-Long Wey
◽
A. Osseiran
◽
J.L. Huertas
Keyword(s):
Design For Test
◽
Signal Design
◽
Mixed Signal
◽
Soc Testing
Download Full-text
Speed Enhanced Mixed Signal Design-for-Test Using Hybrid Fault Based Testing Algorithms
2010 Second International Conference on Computer Modeling and Simulation
◽
10.1109/iccms.2010.138
◽
2010
◽
Author(s):
Sushanth Puthiyottil
◽
E. Sureshkumar
Keyword(s):
Design For Test
◽
Signal Design
◽
Mixed Signal
◽
Testing Algorithms
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Design-for-test methodology for Motorola PowerPC/sup TM/ microprocessors
International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034)
◽
10.1109/test.1999.805812
◽
2003
◽
Cited By ~ 11
Author(s):
M. Abadir
◽
R. Raina
Keyword(s):
Design For Test
◽
Test Methodology
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Mixed-signal custom IC control processors incorporating design for test/self-test
10.1049/ic:19971002
◽
1997
◽
Author(s):
I.A. Grout
Keyword(s):
Design For Test
◽
Mixed Signal
◽
Self Test
Download Full-text
Design-for-Test of Mixed-Signal Integrated Circuits
2006 49th IEEE International Midwest Symposium on Circuits and Systems
◽
10.1109/mwscas.2006.382189
◽
2006
◽
Author(s):
Adoracion Rueda
◽
Jose L. Huertas
Keyword(s):
Integrated Circuits
◽
Design For Test
◽
Mixed Signal
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Test and Design-for-Test of Mixed-Signal Integrated Circuits
Information Technology - IFIP International Federation for Information Processing
◽
10.1007/1-4020-8159-6_7
◽
2006
◽
pp. 183-212
Author(s):
Marcelo Lubaszewski
◽
Jose Luis Huertas
Keyword(s):
Integrated Circuits
◽
Design For Test
◽
Mixed Signal
Download Full-text
Achieving design closure in a typical mixed-signal ASIC; a Design-For-Test centric approach.
10.1109/icecs.2005.4633429
◽
2005
◽
Author(s):
Sverre Wichlund
Keyword(s):
Design For Test
◽
Mixed Signal
◽
Design Closure
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