Proceedings of the Ninth Asian Test Symposium
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84

(FIVE YEARS 0)

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9

(FIVE YEARS 0)

Published By IEEE

0769508871

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Mixed-signal SoC testing: is mixed-signal design-for-test on its way?

Proceedings of the Ninth Asian Test Symposium ◽

10.1109/ats.2000.893595 ◽

2005 ◽

Author(s):

Chin-Long Wey ◽

A. Osseiran ◽

J.L. Huertas

Keyword(s):

Design For Test ◽

Signal Design ◽

Mixed Signal ◽

Soc Testing

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Collaboration between industry and academia in test research

Proceedings of the Ninth Asian Test Symposium ◽

10.1109/ats.2000.893596 ◽

2005 ◽

Author(s):

Kwang Ting Cheng ◽

V. Agrawal ◽

Jing-Yang Jou ◽

Li.-C. Wang ◽

Chi-Feng Wu ◽

...

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Taiwan test industry session: value added testing in the new millennium

Proceedings of the Ninth Asian Test Symposium ◽

10.1109/ats.2000.893594 ◽

2005 ◽

Author(s):

Chung-Len Lee

Keyword(s):

Value Added ◽

New Millennium

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Accumulation-based concurrent fault detection for linear digital state variable systems

Proceedings of the Ninth Asian Test Symposium ◽

10.1109/ats.2000.893671 ◽

2002 ◽

Cited By ~ 3

Author(s):

I. Bayraktaroglu ◽

A. Orailoglu

Keyword(s):

Fault Detection ◽

State Variable

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An efficient parallel transparent diagnostic BIST

Proceedings of the Ninth Asian Test Symposium ◽

10.1109/ats.2000.893640 ◽

2002 ◽

Cited By ~ 1

Author(s):

D.C. Huang ◽

W.B. Jone

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Faster processing for microprocessor functional ATPG

Proceedings of the Ninth Asian Test Symposium ◽

10.1109/ats.2000.893624 ◽

2002 ◽

Author(s):

J. Hirase ◽

S. Yoshimura

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Forecasting the efficiency of test generation algorithms for digital circuits

Proceedings of the Ninth Asian Test Symposium ◽

10.1109/ats.2000.893622 ◽

2002 ◽

Author(s):

Shiyi Xu ◽

Wei Cen

Keyword(s):

Test Generation ◽

Digital Circuits

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TOF: a tool for test pattern generation optimization of an FPGA application oriented test

Proceedings of the Ninth Asian Test Symposium ◽

10.1109/ats.2000.893644 ◽

2002 ◽

Cited By ~ 11

Author(s):

M. Renovell ◽

J.M. Portal ◽

P. Faure ◽

J. Figueras ◽

Y. Zorian

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation

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DFT closure

Proceedings of the Ninth Asian Test Symposium ◽

10.1109/ats.2000.893592 ◽

2002 ◽

Cited By ~ 4

Author(s):

F. Hayat ◽

T.W. Williams ◽

R. Kapur ◽

D. Hsu

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DFT and BIST techniques for the future

Proceedings of the Ninth Asian Test Symposium ◽

10.1109/ats.2000.893591 ◽

2002 ◽

Author(s):

Hsin-Po Wang ◽

J. Turino

Keyword(s):

The Future

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