scholarly journals Test and Design-for-Test of Mixed-Signal Integrated Circuits

2006 ◽  
pp. 183-212
Author(s):  
Marcelo Lubaszewski ◽  
Jose Luis Huertas
Keyword(s):  
Integrated Circuits ◽  
Design For Test ◽  
Mixed Signal

The Design and Validation of DFT System for Mixed-Signal Circuits Based on JTAG

2013 ◽  
Vol 427-429 ◽  
pp. 636-639
Author(s):  
Guo Gang Liao ◽  
Jun Li
Keyword(s):  
Integrated Circuits ◽  
Large Scale ◽  
Test System ◽  
Design For Test ◽  
Boundary Scan ◽  
Electronic Control ◽  
Integrity Test ◽  
Mixed Signal ◽  
Mixed Signal Circuits ◽  
Electronic Control System

Nowadays with the increases of the density of large scale integrated circuits, researches of Design for Test (DFT) become more and more important, JTAG (JTAG: Joint Test Action Group, also called Boundary Scan ) has been widely used in test area , which improves the testability and reliability of mixed-signal circuits. This paper puts forward a scheme to design a Built-in Test System (BITS) based on boundary scan technology. The BITS is realized in a weapon electronic control system, which is composed of mixed-signal circuits including ARM, AD/DA, FPGA, etc. With this method, several test experiments are carried out in the BITS, which include infrastructure integrity test, interconnect test, cluster test, AD/DA test and so on. The results of experiments show that the Built-in Test System based on JTAG can work normally, which is able to reduce effectively the complexity and the time of test. In a word, the capability of BITS is viable and the system is a virtual tool in the process of DFT design and application.

Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits

2021 ◽  
Author(s):  
Sanmitra Banerjee ◽  
Arjun Chaudhuri ◽  
Shao-Chun Hung ◽  
Krishnendu Chakrabarty
Keyword(s):  
Integrated Circuits ◽  
Design For Test
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