Proceedings International Test Conference 1992
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131

(FIVE YEARS 0)

H-INDEX

19

(FIVE YEARS 0)

Published By IEEE

0780307607

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Simulation Of an Integrated Design and Test Environment For Mixed Signal Integrated Circuits

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527850 ◽

2005 ◽

Cited By ~ 11

Author(s):

S.C. Bateman ◽

W.H. Kao

Keyword(s):

Integrated Circuits ◽

Integrated Design ◽

Test Environment ◽

Mixed Signal

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ACCORD : Automatic Catching and Correction of Logic Design Errors in Combinational Circuits

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527896 ◽

2005 ◽

Cited By ~ 13

Author(s):

Pi-Yu Chung ◽

I.N. Hajj

Keyword(s):

Logic Design ◽

Combinational Circuits

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CCD IMAGE SENSOR TEST USING CELLULAR AUTOMATON-TYPE PATTERN RECOGNITION SYSTEM

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527825 ◽

2005 ◽

Cited By ~ 1

Author(s):

H. Kato

Keyword(s):

Pattern Recognition ◽

Cellular Automaton ◽

Recognition System ◽

Image Sensor ◽

Pattern Recognition System ◽

Ccd Image Sensor ◽

Type Pattern ◽

Ccd Image

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ENHANCED PROBE CARD FACILITATES AT-SPEED WAFER PROBING IN VERY HIGH DENSITY APPLICATIONS

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527920 ◽

2005 ◽

Cited By ~ 3

Author(s):

E. Subramanian ◽

R. Nelson

Keyword(s):

High Density ◽

Wafer Probing ◽

Probe Card ◽

Very High

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I/sub DDQ/ TESTING IN CMOS DIGITAL ASIC'S - PUTTING IT ALL TOGETHER

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527815 ◽

2005 ◽

Cited By ~ 18

Author(s):

R. Perry

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Sequential circuit diagnosis based on formal verification techniques

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527819 ◽

2005 ◽

Cited By ~ 4

Author(s):

G. Cabodi ◽

P. Camurati ◽

F. Corno ◽

P. Prinetto ◽

M.S. Reorda

Keyword(s):

Formal Verification ◽

Sequential Circuit ◽

Verification Techniques

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Parity-Scan Design to Reduce the Cost of Test Application

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527835 ◽

2005 ◽

Cited By ~ 17

Author(s):

H. Fujiwara ◽

A. Yamamoto

Keyword(s):

Scan Design ◽

Test Application ◽

The Cost

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Optimized BIST Strategies for Programmable Data Paths Based on Cellular Automata

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527811 ◽

2005 ◽

Cited By ~ 6

Author(s):

J. vanSas ◽

F. Catthoor ◽

H. DeMan

Keyword(s):

Cellular Automata

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A STEADY-STATE RESPONSE TEST GENERATION FOR MIXED-SIGNAL INTEGRATED CIRCUITS

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527851 ◽

2005 ◽

Cited By ~ 4

Author(s):

A.F. Alani ◽

G. Musgrave ◽

A.P. Ambler

Keyword(s):

Steady State ◽

Integrated Circuits ◽

Test Generation ◽

Steady State Response ◽

Mixed Signal ◽

Response Test ◽

State Response

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Detection of undetectable faults using IDDQ testing

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527899 ◽

2005 ◽

Cited By ~ 11

Author(s):

R.K. Gulati ◽

Weiwei Mao ◽

D.K. Goel

Keyword(s):

Iddq Testing

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