Laser interferometry in the determination of electron concentration in plasma jets

1967 ◽  
Vol 7 (2) ◽  
pp. 143-144 ◽  
Author(s):  
A. A. Ovsyannikov ◽  
L. S. Polak ◽  
R. E. Rovinskii ◽  
A. G. Rozanov ◽  
N. N. Shvindt
1977 ◽  
Vol 1 (4) ◽  
pp. 206-211 ◽  
Author(s):  
S.A. Self ◽  
F.O. Reigel ◽  
R.M. Clements ◽  
R.K. James

Author(s):  
R. Luna ◽  
M. A. Satorre ◽  
G. Blanes ◽  
M. C. Santonja ◽  
M. Domingo ◽  
...  

2019 ◽  
Vol 115 ◽  
pp. 59-66 ◽  
Author(s):  
Tao Sun ◽  
Weiwei Zheng ◽  
Yingjie Yu ◽  
Anand K. Asundi ◽  
Sergiy Valyukh

1986 ◽  
Vol 89 ◽  
Author(s):  
F. Pool ◽  
J. Kossut ◽  
U. Debska ◽  
R. Reifenberger ◽  
J. K. Furdyna

AbstractThe electrical resistivity, electron concentration, and mobility of Hg1-xFexSe are reported for 4.2K < T < 300K and for 0.0001 < x < 0.12. The data are interpreted within an electronic band structure model that assumes the existence of resonant donors (due to the presence of Fe ions) whose ground state energy coincides with the conduction band continuum. The electron concentration data enable determination of the value of the donor energy as a function of the temperature and the crystal composition. The low temperature electron mobility for ∼ 0.0003 ≤ x ≤ 0.01 is considerably higher than expected and indicates a reduction of the charged impurity scattering effects at low temperatures.


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