The yield strength anisotropy of aluminum-lithium sheet is known to be strongly dependent on
crystallographic texture and grain morphology. In this study, the microstructure and texture of
unrecrystallized and recrystallized variants of 2090 were examined in an SEM, using a combination of
backscattered electron imaging and Kikuchi patterns. Local orientation measurements both through
the sheet thickness and parallel to the rolling direction were used to determine the degree of
misorientation between nearest-neighbor grains. Yield strength predictions based on the spatially
resolved texture measurements show that the course, recrystallized grains have reduced in-plane and
through-thickness anisotropy compared to the unrecrystallized structure.