A study on the development of a filing system for funduscopic images with a personal computer for Twin AMHTS

1993 ◽  
Vol 17 (3-4) ◽  
pp. 257-266
Author(s):  
Hiroshi Inada ◽  
Hiroyuki Horio ◽  
Kiyomu Ishikawa ◽  
Hiromichi Yoshikawa ◽  
Eishi Harasawa ◽  
...  
1997 ◽  
Vol 45 (4) ◽  
pp. AB29
Author(s):  
T. Fujiki ◽  
Y. Saitoh ◽  
K. Einami ◽  
J. Watari ◽  
M. Nomura ◽  
...  

1994 ◽  
Vol 43 (1-2) ◽  
pp. 71-73 ◽  
Author(s):  
Koichi Kurisu ◽  
Yoshio Hishikawa ◽  
Masayuki Izumi ◽  
Midori Taniguchi ◽  
Norihiko Kamikonya ◽  
...  

Author(s):  
Gianluigi Botton ◽  
Gilles L'espérance

As interest for parallel EELS spectrum imaging grows in laboratories equipped with commercial spectrometers, different approaches were used in recent years by a few research groups in the development of the technique of spectrum imaging as reported in the literature. Either by controlling, with a personal computer both the microsope and the spectrometer or using more powerful workstations interfaced to conventional multichannel analysers with commercially available programs to control the microscope and the spectrometer, spectrum images can now be obtained. Work on the limits of the technique, in terms of the quantitative performance was reported, however, by the present author where a systematic study of artifacts detection limits, statistical errors as a function of desired spatial resolution and range of chemical elements to be studied in a map was carried out The aim of the present paper is to show an application of quantitative parallel EELS spectrum imaging where statistical analysis is performed at each pixel and interpretation is carried out using criteria established from the statistical analysis and variations in composition are analyzed with the help of information retreived from t/γ maps so that artifacts are avoided.


Author(s):  
Stuart McKernan

For many years the concept of quantitative diffraction contrast experiments might have consisted of the determination of dislocation Burgers vectors using a g.b = 0 criterion from several different 2-beam images. Since the advent of the personal computer revolution, the available computing power for performing image-processing and image-simulation calculations is enormous and ubiquitous. Several programs now exist to perform simulations of diffraction contrast images using various approximations. The most common approximations are the use of only 2-beams or a single systematic row to calculate the image contrast, or calculating the image using a column approximation. The increasing amount of literature showing comparisons of experimental and simulated images shows that it is possible to obtain very close agreement between the two images; although the choice of parameters used, and the assumptions made, in performing the calculation must be properly dealt with. The simulation of the images of defects in materials has, in many cases, therefore become a tractable problem.


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