Focusing characteristics of a diffraction grating in an open resonator

1985 ◽  
Vol 28 (5) ◽  
pp. 444-453
Author(s):  
V. P. Androsov ◽  
�. I. Veliev ◽  
A. A. Vertii
Keyword(s):  
Diffraction Grating ◽  
Open Resonator

scholarly journals Summation of Powers in Open Resonator with Slotted Coupling Elements

2021 ◽  
Vol 10 (3) ◽  
pp. 7-13
Author(s):  
I. Kuzmichev ◽  
B. I. Muzychishin ◽  
A. Y. Popkov
Keyword(s):  
Diffraction Grating ◽  
Open Resonator ◽  
Oscillation Mode ◽  
Gunn Diode ◽  
Axially Asymmetric ◽  
Slot Coupling

The paper analyzes the summation of the powers of two sources in a hemispherical open resonator (OR) during its tuning. The first higher axially asymmetric TEM10q oscillation mode is excited in the resonator. A circuit with an E- tee waveguide is proposed, which makes it possible to research the summation of the powers using a Gunn diode. Studies of the conducting part of the millimeter range have been undertaken. It is shown that the coefficient of powers summation of two sources in the OR using slot coupling elements does not exceed 72%. The use of one H- polarized diffraction grating, which is in the resonator, does not lead to a significant increase in the summation coefficient when moving it. This is due to the excitation of the first type of TEM10q oscillations in the resonator.

Uniformity of Magnification from Different Electron Microscopes

1967 ◽  
Vol 25 ◽  
pp. 32-33
Author(s):  
Godfrey C. Hoskins ◽  
V. Williams ◽  
V. Allison
Keyword(s):  
Diffraction Grating ◽  
The Other ◽  
Carbon Replica ◽  
Electron Microscopes ◽  
The Stability

The method demonstrated is an adaptation of a proven procedure for accurately determining the magnification of light photomicrographs. Because of the stability of modern electrical lenses, the method is shown to be directly applicable for providing precise reproducibility of magnification in various models of electron microscopes.A readily recognizable area of a carbon replica of a crossed-line diffraction grating is used as a standard. The same area of the standard was photographed in Phillips EM 200, Hitachi HU-11B2, and RCA EMU 3F electron microscopes at taps representative of the range of magnification of each. Negatives from one microscope were selected as guides and printed at convenient magnifications; then negatives from each of the other microscopes were projected to register with these prints. By deferring measurement to the print rather than comparing negatives, correspondence of magnification of the specimen in the three microscopes could be brought to within 2%.

Shadow Theory of Diffraction Grating: Reciprocity, Symmetry and Average Filter

2014 ◽  
Vol E97.C (10) ◽  
pp. 1036-1040 ◽  
Author(s):  
Junichi NAKAYAMA ◽  
Yasuhiko TAMURA
Keyword(s):  
Diffraction Grating ◽  
Average Filter

Millimeter-Wave Solid-State Oscillator with Elliptical Open Resonator

2002 ◽  
Vol 58 (11-12) ◽  
pp. 6
Author(s):  
A. V. Arkhipov ◽  
O. I. Bilous ◽  
A. P. Koretskiy ◽  
Anatoly Ivanovich Fisun
Keyword(s):  
Solid State ◽  
Millimeter Wave ◽  
Open Resonator
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