Diffraction of a plane wave by a step discontinuity in an impedance plane

2000 ◽  
Vol 102 (4) ◽  
pp. 4195-4202
Author(s):  
V. V. Zalipaev
Keyword(s):  
Plane Wave ◽  
Step Discontinuity ◽  
Impedance Plane

scholarly journals Plane wave diffraction by a slit in an impedance plane and a complementary impedance strip

Radio Science ◽  
2004 ◽  
Vol 39 (2) ◽  
pp. n/a-n/a ◽  
Author(s):  
Gokhan Çınar ◽  
Alinur Büyükaksoy
Keyword(s):  
Plane Wave ◽  
Wave Diffraction ◽  
Impedance Plane ◽  
Plane Wave Diffraction ◽  
Impedance Strip

Plane Wave Diffraction by Impedance Planar Surfaces with a Step Discontinuity

2004 ◽  
Vol 24 (8) ◽  
pp. 623-635
Author(s):  
BAHATTIN TURETKEN ◽  
OSMAN YILDIRIM
Keyword(s):  
Plane Wave ◽  
Wave Diffraction ◽  
Step Discontinuity ◽  
Planar Surfaces ◽  
Plane Wave Diffraction

SCATTERING AT THE JUNCTION OF TWO SEMI-INFINITE PARALLEL-IMPEDANCE PLANE WAVE GUIDES

1965 ◽  
Vol 43 (5) ◽  
pp. 849-854 ◽  
Author(s):  
D. S. Karjala ◽  
R. Mittra
Keyword(s):  
Exact Solution ◽  
Plane Wave ◽  
Wave Guide ◽  
General Interest ◽  
Mode Matching ◽  
Impedance Plane ◽  
Matching Technique ◽  
Wave Guides ◽  
Mode Matching Technique

This paper considers an arbitrary mode in a parallel-impedance plane wave guide to be incident upon the junction of this guide with another. This problem has been used in an earlier work as a model for v.l.f. propagation past a shoreline, but is also of more general interest. A mode-matching technique results in the exact solution, and explicit results for the mode coefficients of both the transmitted and reflected fields are given.

DIFFRACTION OF EM PLANE WAVE BY A SLIT IN AN IMPEDANCE PLANE USING MALIUZHINETS FUNCTION

2008 ◽  
Vol 5 ◽  
pp. 265-273 ◽  
Author(s):  
Muhammad Naveed ◽  
Qaisar Abbas Naqvi ◽  
Kohei Hongo
Keyword(s):  
Plane Wave ◽  
Impedance Plane

Theory and Errors in Stereo Electron Microscopy

1968 ◽  
Vol 26 ◽  
pp. 336-337
Author(s):  
J. M. Pankratz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Plane Wave ◽  
Focal Length ◽  
Foil Thickness ◽  
Points Of Interest ◽  
Transmission Electron ◽  
Vertical Spacing ◽  
Illuminating System

It is often desirable in transmission electron microscopy to know the vertical spacing of points of interest within a specimen. However, in order to measure a stereo effect, one must have two pictures of the same area taken from different angles, and one must have also a formula for converting measured differences between corresponding points (parallax) into a height differential.Assume (a) that the impinging beam of electrons can be considered as a plane wave and (b) that the magnification is the same at the top and bottom of the specimen. The first assumption is good when the illuminating system is overfocused. The second assumption (the so-called “perspective error”) is good when the focal length is large (3 x 107Å) in relation to foil thickness (∼103 Å).

A hybrid Gaussian and plane wave density functional scheme

1997 ◽  
Vol 92 (3) ◽  
pp. 477-487 ◽  
Author(s):  
GERALD LIPPERT ◽  
JuRG HUTTER ◽  
MICHELE PARRINELLO
Keyword(s):  
Plane Wave ◽  
Density Functional ◽  
Functional Scheme
Sign in / Sign up

Export Citation Format

Share Document