Spectroscopic investigation of the plasma of a high-current diffuse discharge in He/Ar/CF2Cl2(CCl4) mixtures

1999 ◽  
Vol 66 (2) ◽  
pp. 256-262
Author(s):  
A. K. Shuaibov
1979 ◽  
Vol 40 (C7) ◽  
pp. C7-281-C7-282
Author(s):  
A. P. Kchuzeev ◽  
Yu. D. Korolev ◽  
V. A. Kuzmin ◽  
G. A. Mesyats ◽  
V. P. Rotshtein ◽  
...  

Author(s):  
R. Methling ◽  
S. Gorchakov ◽  
M. V. Lisnyak ◽  
St. Franke ◽  
A. Khakpour ◽  
...  

2010 ◽  
Vol 43 (43) ◽  
pp. 434003 ◽  
Author(s):  
M E Rouffet ◽  
M Wendt ◽  
G Goett ◽  
R Kozakov ◽  
H Schoepp ◽  
...  

2012 ◽  
Vol 45 (18) ◽  
pp. 189501 ◽  
Author(s):  
M E Rouffet ◽  
M Wendt ◽  
G Goett ◽  
R Kozakov ◽  
H Schoepp ◽  
...  

1966 ◽  
Vol 4 (6) ◽  
pp. 349-352
Author(s):  
L. S. Nikolaevskii ◽  
A. F. Simonenko ◽  
S. G. Grenishin

2017 ◽  
Vol 50 (18) ◽  
pp. 185203 ◽  
Author(s):  
A Khakpour ◽  
R Methling ◽  
D Uhrlandt ◽  
St Franke ◽  
S Gortschakow ◽  
...  

1965 ◽  
Vol 5 ◽  
pp. 120-130
Author(s):  
T. S. Galkina

It is necessary to have quantitative estimates of the intensity of lines (both absorption and emission) to obtain the physical parameters of the atmosphere of components.Some years ago at the Crimean observatory we began the spectroscopic investigation of close binary systems of the early spectral type with components WR, Of, O, B to try and obtain more quantitative information from the study of the spectra of the components.


Author(s):  
R. Hutchings ◽  
I.P. Jones ◽  
M.H. Loretto ◽  
R.E. Smallman

There is increasing interest in X-ray microanalysis of thin specimens and the present paper attempts to define some of the factors which govern the spatial resolution of this type of microanalysis. One of these factors is the spreading of the electron probe as it is transmitted through the specimen. There will always be some beam-spreading with small electron probes, because of the inevitable beam divergence associated with small, high current probes; a lower limit to the spatial resolution is thus 2αst where 2αs is the beam divergence and t the specimen thickness.In addition there will of course be beam spreading caused by elastic and inelastic interaction between the electron beam and the specimen. The angle through which electrons are scattered by the various scattering processes can vary from zero to 180° and it is clearly a very complex calculation to determine the effective size of the beam as it propagates through the specimen.


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