A note on grain boundary diffusion controlled cavity growth during elevated temperature fatigue

1985 ◽  
Vol 16 (2) ◽  
pp. 300-302 ◽  
Author(s):  
N. Y. Tang ◽  
A. Plumtree
2000 ◽  
Vol 122 (3) ◽  
pp. 294-299
Author(s):  
R. Mohan ◽  
J. Zhang ◽  
F. W. Brust

The effect of elastic accommodation on the grain boundary diffusion-controlled void growth was analyzed using an axisymmetric unit cell model. An incremental form of the virtual work principle was used to formulate the boundary value problem involving grain boundary diffusion. The model accounts for material elasticity and void interaction effects. Analyses are performed for initially spherical voids spaced periodically along the grain boundary. The results of the analyses on void growth rates agree well with the Hull-Rimmer model after the initial transient time. During the elastic transient, void growth rates can be several orders of magnitude higher than the steady state growth rate. Though the elastic transient time may occupy a small portion of the total rupture time, in metallic components experiencing cyclic loading conditions with short hold times, elasticity effects may be important. [S0094-4289(00)00903-8]


2009 ◽  
Vol 289-292 ◽  
pp. 763-767 ◽  
Author(s):  
Z. Balogh ◽  
Z. Erdélyi ◽  
Dezső L. Beke ◽  
Alain Portavoce ◽  
Christophe Girardeaux ◽  
...  

Diffusion controlled processes play a crucial role in the degradation of technical materials. At low temperatures the most significant of them is the diffusion along grain boundaries. In thin film geometry one of the best methods for determining the grain boundary (GB) diffusion coefficient of an impurity element is the Hwang-Balluffi method, in which a surface sensitive technique is used to follow the surface accumulation kinetics. Results of grain boundary diffusion measurements, carried out in our laboratory by this method in three different materials systems (Ag/Pd, Ag/Cu and Au/Ni) are reviewed. In case of Ag diffusion along Pd GBs the surface accumulation was followed by AES method. The data points can be well fitted by an Arrhenius function with an activation energy Q=0.99eV


2003 ◽  
Vol 83 (1) ◽  
pp. 29-38 ◽  
Author(s):  
D. Moldovan ◽  
D. Wolf ◽  
S. R. Phillpot ◽  
A. K. Mukherjee ◽  
H. Gleiter

1973 ◽  
Vol 81 (933) ◽  
pp. 203-210
Author(s):  
Tomozo NISHIKAWA ◽  
Toshihiko NISHIDA ◽  
Kenzo IWAMOTO ◽  
Hiroshi SHOMON ◽  
Isao UEI

2003 ◽  
Vol 216-217 ◽  
pp. 181-188 ◽  
Author(s):  
I. Apykhtina ◽  
Boris S. Bokstein ◽  
S. Gulevskii ◽  
Olga Kozlova ◽  
A. Petelin ◽  
...  

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