A SOM-FBPN-ensemble approach with error feedback to adjust classification for wafer-lot completion time prediction
2007 ◽
Vol 37
(7-8)
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pp. 782-792
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2008 ◽
Vol 42
(11-12)
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pp. 1206-1216
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Keyword(s):
Keyword(s):
2008 ◽
Vol 71
(16-18)
◽
pp. 3193-3201
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2007 ◽
Vol 158
(19)
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pp. 2153-2168
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Keyword(s):