Optimization of different structural parameters of GeSn/SiGeSn Quantum Well Infrared Photodetectors (QWIPs) for low dark current and high responsivity

Author(s):  
Soumava Ghosh ◽  
Anirban Bhattacharyya ◽  
Gopa Sen ◽  
Bratati Mukhopadhyay
2009 ◽  
Vol 52 (6) ◽  
pp. 220-223 ◽  
Author(s):  
Fabrizio Castellano ◽  
Rita C. Iotti ◽  
Fausto Rossi ◽  
Jerome Faist ◽  
Emmanuel Lhuillier ◽  
...  

1993 ◽  
Vol 73 (4) ◽  
pp. 2029-2031 ◽  
Author(s):  
H. C. Liu ◽  
A. G. Steele ◽  
M. Buchanan ◽  
Z. R. Wasilewski

1999 ◽  
Vol 33 (2) ◽  
pp. 162-169
Author(s):  
Kwok-Keung Chong ◽  
Mau-Phon Houng ◽  
Yeong-Her Wang ◽  
Chang-Hsing Chu ◽  
Chen-I Hung

1990 ◽  
Vol 216 ◽  
Author(s):  
W. S. Hobson ◽  
A. Zussman ◽  
B. F. Levine ◽  
S. J. Pearton ◽  
V. Swaminathan ◽  
...  

ABSTRACTWe have grown, fabricated, and measured GaAs quantum well infrared photodetectors (QWIPs) using organometallic vapor phase epitaxy (OMVPE). The epitaxial layers were characterized by electrochemical capacitance-voltage profiling, double-crystal X-ray diffraction, cathodoluminescence, and infrared absorption. Dark current, responsivity spectra, and detectivity were measured for the QWIP devices. The performance of these QWIPs was comparable to detectors grown using MBE. This is of importance since OMVPE has advantages for wafer throughout and cost.


2007 ◽  
Vol 56 (9) ◽  
pp. 5424
Author(s):  
Xiong Da-Yuan ◽  
Li Ning ◽  
Xu Wen-Lan ◽  
Zhen Hong-Lou ◽  
Li Zhi-Feng ◽  
...  

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