Nanotube structures: material characterization and structural analysis of Ge–Se thin films

2018 ◽  
Vol 30 (3) ◽  
pp. 2470-2478 ◽  
Author(s):  
Muhammad R. Latif ◽  
Dmitri A. Tenne ◽  
Maria Mitkova
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Material Characterization

Structural analysis of Cu 1−x Ag x GaSe 2 bulk materials and thin films

2000 ◽  
Vol 361-362 ◽  
pp. 130-134 ◽  
Author(s):  
M.E Beck ◽  
T Weiss ◽  
D Fischer ◽  
S Fiechter ◽  
A Jäger-Waldau ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Bulk Materials

Optical and structural analysis of plasma-treated and annealed Al–Sb bilayer thin films

Ionics ◽  
2008 ◽  
Vol 15 (2) ◽  
pp. 191-195 ◽  
Author(s):  
S. Inbakumar ◽  
A. Anu kaliani
Keyword(s):  
Thin Films ◽  
Structural Analysis

Transport Characteristics and Structural Analysis of YBa2Cu3O7−x Thin Films Implanted with Argon Ions

1995 ◽  
Vol 147 (1) ◽  
pp. 119-128 ◽  
Author(s):  
Yijie Li ◽  
F. Machalett ◽  
S. Linzen ◽  
F. Schmidl ◽  
P. Seidel
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Argon Ions

Compositional and structural analysis of RF magnetron sputtered La3+-modified PZT thin films

2009 ◽  
Vol 209 (2) ◽  
pp. 991-997 ◽  
Author(s):  
Ravindra Singh ◽  
B.R. Chakraborty ◽  
Nahar Singh ◽  
Harish Bahadur ◽  
T.C. Goel ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Pzt Thin Films

scholarly journals 3D-structural Analysis of Epitaxially-grown Organic Thin Films by a Newly Developed Energy Dispersive X-ray Diffraction System.

Hyomen Kagaku ◽  
1998 ◽  
Vol 19 (4) ◽  
pp. 259-264
Author(s):  
Kenji ISHIDA ◽  
Toshihisa HORIUCHI ◽  
Kazumi MATSUSHIGE MATSUSHIGE
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Organic Thin Films ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray

Evaluation of SiO2 Thin films on piezoelectric substrates using line-focus-beam ultrasonic material characterization system

2019 ◽  
Vol 58 (SG) ◽  
pp. SGGA05 ◽  
Author(s):  
Ryota Suenaga ◽  
Masashi Suzuki ◽  
Shoji Kakio ◽  
Yuji Ohashi ◽  
Mototaka Arakawa ◽  
...  
Keyword(s):  
Thin Films ◽  
Material Characterization ◽  
Focus Beam ◽  
Line Focus

Chemical and structural analysis of TiAl thin films sputter deposited on carbon substrates

1993 ◽  
Vol 61 (1-3) ◽  
pp. 245-250 ◽  
Author(s):  
J.F. Silvain ◽  
J.E. Barbier ◽  
Y. Lepetitcorps ◽  
M. Alnot ◽  
J.J. Ehrhardt
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Carbon Substrates ◽  
Sputter Deposited
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