Reliability Analysis for Electronic Devices Using Beta Generalized Weibull Distribution

2019 ◽  
Vol 43 (5) ◽  
pp. 2501-2514 ◽  
Author(s):  
Sajid Ali ◽  
Shafaqat Ali ◽  
Ismail Shah ◽  
Ali Noori Khajavi
Keyword(s):  
Weibull Distribution ◽  
Reliability Analysis ◽  
Electronic Devices

Reliability analysis for electronic devices using beta-Weibull distribution

2017 ◽  
Vol 33 (8) ◽  
pp. 2521-2530 ◽  
Author(s):  
Luis Carlos Méndez-González ◽  
Luis Alberto Rodríguez-Picón ◽  
Delia Julieta Valles-Rosales ◽  
Roberto Romero-López ◽  
Abel Eduardo Quezada-Carreón
Keyword(s):  
Weibull Distribution ◽  
Reliability Analysis ◽  
Electronic Devices ◽  
Beta Weibull Distribution

scholarly journals Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 108629-108644 ◽  
Author(s):  
Sajid Ali ◽  
Shafaqat Ali ◽  
Ismail Shah ◽  
Ghazanfar Farooq Siddiqui ◽  
Tanzila Saba ◽  
...  
Keyword(s):  
Reliability Analysis ◽  
Exponential Distribution ◽  
Electronic Devices ◽  
Generalized Exponential Distribution

Reliability analysis of thermal core ring spun yarn using two parameter Weibull distribution

2014 ◽  
Vol 105 (10) ◽  
pp. 1042-1049 ◽  
Author(s):  
R. Ramachandran ◽  
B.S Dasaradan ◽  
R. Murugan ◽  
P. Kanakaraj
Keyword(s):  
Weibull Distribution ◽  
Reliability Analysis ◽  
Spun Yarn ◽  
Ring Spun Yarn ◽  
Two Parameter
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