Reliability analysis for electronic devices using beta-Weibull distribution

2017 ◽  
Vol 33 (8) ◽  
pp. 2521-2530 ◽  
Author(s):  
Luis Carlos Méndez-González ◽  
Luis Alberto Rodríguez-Picón ◽  
Delia Julieta Valles-Rosales ◽  
Roberto Romero-López ◽  
Abel Eduardo Quezada-Carreón
Keyword(s):  
Weibull Distribution ◽  
Reliability Analysis ◽  
Electronic Devices ◽  
Beta Weibull Distribution

scholarly journals Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 108629-108644 ◽  
Author(s):  
Sajid Ali ◽  
Shafaqat Ali ◽  
Ismail Shah ◽  
Ghazanfar Farooq Siddiqui ◽  
Tanzila Saba ◽  
...  
Keyword(s):  
Reliability Analysis ◽  
Exponential Distribution ◽  
Electronic Devices ◽  
Generalized Exponential Distribution

scholarly journals Closed form expressions for moments of the beta Weibull distribution

2011 ◽  
Vol 83 (2) ◽  
pp. 357-373 ◽  
Author(s):  
Gauss M Cordeiro ◽  
Alexandre B Simas ◽  
Borko D Stošic
Keyword(s):  
Weibull Distribution ◽  
Closed Form ◽  
Cumulative Distribution Function ◽  
Information Matrix ◽  
Likelihood Estimation ◽  
Real Data ◽  
Cumulative Distribution ◽  
Data Set ◽  
Expected Information ◽  
Beta Weibull Distribution

The beta Weibull distribution was first introduced by Famoye et al. (2005) and studied by these authors and Lee et al. (2007). However, they do not give explicit expressions for the moments. In this article, we derive explicit closed form expressions for the moments of this distribution, which generalize results available in the literature for some sub-models. We also obtain expansions for the cumulative distribution function and Rényi entropy. Further, we discuss maximum likelihood estimation and provide formulae for the elements of the expected information matrix. We also demonstrate the usefulness of this distribution on a real data set.

Reliability analysis of thermal core ring spun yarn using two parameter Weibull distribution

2014 ◽  
Vol 105 (10) ◽  
pp. 1042-1049 ◽  
Author(s):  
R. Ramachandran ◽  
B.S Dasaradan ◽  
R. Murugan ◽  
P. Kanakaraj
Keyword(s):  
Weibull Distribution ◽  
Reliability Analysis ◽  
Spun Yarn ◽  
Ring Spun Yarn ◽  
Two Parameter
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