Structure determination of amorphous Ge, GeO2 and GeSe by fourier analysis of extended x-ray absorption fine structure (EXAFS)

1972 ◽  
Vol 8-10 ◽  
pp. 401-407 ◽  
Author(s):  
Dale E. Sayers ◽  
Farrel W. Lytle ◽  
Edward A. Stern
2008 ◽  
Vol 47 (24) ◽  
pp. 11543-11550 ◽  
Author(s):  
Ritimukta Sarangi ◽  
Rosalie K. Hocking ◽  
Michael L. Neidig ◽  
Maurizio Benfatto ◽  
Theodore R. Holman ◽  
...  

1992 ◽  
Vol 46 (15) ◽  
pp. 9869-9872 ◽  
Author(s):  
J. C. Woicik ◽  
T. Kendelewicz ◽  
K. E. Miyano ◽  
M. Richter ◽  
C. E. Bouldin ◽  
...  

2008 ◽  
Vol 42 (1) ◽  
pp. 015412 ◽  
Author(s):  
Zhihu Sun ◽  
Hiroyuki Oyanagi ◽  
Noriyuki Uchida ◽  
Takehide Miyazaki ◽  
Toshihiko Kanayama

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