Automatic test pattern generation for industrial circuits with restrictors

Microelectronics Journal ◽

10.1016/0026-2692(95)00005-3 ◽

1995 ◽

Vol 26 (7) ◽

pp. 635-645 ◽

Author(s):

M.H. Konijnenburg ◽

J.Th. van der Linden ◽

A.J. van de Goor

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test ◽

Industrial Circuits

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An automatic test pattern generation framework for combinational threshold logic networks

IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. ◽

10.1109/iccd.2004.1347974 ◽

2004 ◽

Author(s):

P. Gupta ◽

Rui Zhang ◽

N.K. Jha

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Threshold Logic ◽

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Automatic test pattern generation can be solved as a constraint satisfaction problem

Microprocessing and Microprogramming ◽

10.1016/0165-6074(93)90216-8 ◽

1993 ◽

Vol 38 (1-5) ◽

pp. 715-722

Author(s):

K. Tilly ◽

L. Surján ◽

G. Román

Keyword(s):

Constraint Satisfaction ◽

Test Pattern ◽

Constraint Satisfaction Problem ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Automatic Test Pattern Generation for Multiple Missing Gate Faults in Reversible Circuits

Reversible Computation - Lecture Notes in Computer Science ◽

10.1007/978-3-319-59936-6_14 ◽

2017 ◽

pp. 176-182 ◽

Author(s):

Anmol Prakash Surhonne ◽

Anupam Chattopadhyay ◽

Robert Wille

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test ◽

Reversible Circuits

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Automatic test pattern generation for iterative logic arrays

Journal of Science and Technology (Ghana) ◽

10.4314/just.v24i2.32911 ◽

2005 ◽

Vol 24 (2) ◽

Author(s):

KO Boateng

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Analog Automatic Test Pattern Generation for Quasi-Static Structural Test

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2008.2003517 ◽

2009 ◽

Vol 17 (10) ◽

pp. 1383-1391 ◽

Author(s):

A. Zjajo ◽

J.P. de Gyvez

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test ◽

Structural Test

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Efficient Boolean Characteristic Function for Timed Automatic Test Pattern Generation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2009.2013269 ◽

2009 ◽

Vol 28 (3) ◽

pp. 417-425 ◽

Author(s):

Yu-Min Kuo ◽

Yue-Lung Chang ◽

Shih-Chieh Chang

Keyword(s):

Characteristic Function ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Current directions in automatic test-pattern generation

Computer ◽

10.1109/2.803642 ◽

1999 ◽

Vol 32 (11) ◽

pp. 58-64 ◽

Author(s):

Kwang-Ting Cheng ◽

A. Krstic

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Automatic test pattern generation on multiprocessors: a summary of results

Knowledge Based Computer Systems - Lecture Notes in Computer Science ◽

10.1007/bfb0018367 ◽

2005 ◽

pp. 39-51 ◽

Author(s):

Sunil Arvindam ◽

Vipin Kumar ◽

V. Nageshwara Rao ◽

Vineet Singh

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Automatic Test Pattern Generation

Digital Logic Testing and Simulation ◽

10.1002/0471457787.ch4 ◽

2003 ◽

pp. 165-231

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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A distributed automatic test pattern generation system

High-Performance Computing and Networking - Lecture Notes in Computer Science ◽

10.1007/bfb0020356 ◽

2005 ◽

pp. 105-110 ◽

Author(s):

Peter A. Krauss

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Generation System ◽

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