Partial pair correlation functions of La1−x(AlGaAu)x metallic glasses from x-ray diffraction data

1982 ◽  
Vol 44 (7) ◽  
pp. 983-986 ◽  
Author(s):  
Arthur Williams
1993 ◽  
Vol 48 (7) ◽  
pp. 777-783 ◽  
Author(s):  
A. Präffcke ◽  
P. Lamparter ◽  
S. Steeb

Abstract The amorphous alloys Ti67Si33 , V67Si33 , and Cr67Si33 were produced by sputtering. Their structure was investigated by X-ray and neutron diffraction. X-ray diffraction showed that the structure of the three metallic glasses is not isomorphous. Neutron diffraction showed that Si-Si atomic pairs occur preferentially with distances distinctly larger than the atomic diameter of the Si atoms. For T67Si33 partial pair correlation functions could be evaluated from combination of the X-ray and the neutron data.The structural results are compared with the structure of amorphous Mn74Si23P3 .


1995 ◽  
Vol 50 (9) ◽  
pp. 831-836
Author(s):  
R. M. Hagenmayer ◽  
P. Lamparter ◽  
S. Steeb

Abstract The molten alloys Au28.5Mn71.5 and Au68Mn32 are investigated with the energy dispersive X-ray diffraction method which works rather fast so that the evaporation loss of Mn from the molten alloys is kept low. From the observed prepeak follows that both melts are compound-forming but the gold rich melt Au68Mn32 shows only 50% of the short range order existent within the Au28.5Mn71.5 melt. Total structure factors and total pair correlation functions are discussed.


1994 ◽  
Vol 49 (4-5) ◽  
pp. 530-534 ◽  
Author(s):  
Th. Halm ◽  
H. Neumann ◽  
W. Hoyer

Abstract Using X-ray diffraction, structure factors and pair correlation functions of several molten Cu-Sb alloys and pure antimony were determined and compared with published structural, thermodynamic and electronic properties. The eutectic concentration Cu37Sb63 was investigated in dependence on temperature, and a model structure factor was calculated applying a segregation model.


1977 ◽  
Vol 74 (2) ◽  
pp. 629-645 ◽  
Author(s):  
L Makowski ◽  
DLD Caspar ◽  
WC Phillips ◽  
DA Goodenough

Models for the spatial distribution of protein, lipid and water in gap junction structures have been constructed from the results of the analysis of X-ray diffraction data described here and the electron microscope and chemical data presented in the preceding paper (Caspar, D. L. D., D. A. Goodenough, L. Makowski, and W.C. Phillips. 1977. 74:605-628). The continuous intensity distribution on the meridian of the X-ray diffraction pattern was measured, and corrected for the effects of the partially ordered stacking and partial orientation of the junctions in the X-ray specimens. The electron density distribution in the direction perpendicular to the plane of the junction was calculated from the meridional intensity data. Determination of the interference function for the stacking of the junctions improved the accuracy of the electron density profile. The pair-correlation function, which provides information about the packing of junctions in the specimen, was calculated from the interference function. The intensities of the hexagonal lattice reflections on the equator of the X-ray pattern were used in coordination with the electron microscope data to calculate to the two-dimensional electron density projection onto the plane of the membrane. Differences in the structure of the connexons as seen in the meridional profile and equatorial projections were shown to be correlated to changes in lattice constant. The parts of the junction structure which are variable have been distinguished from the invariant parts by comparison of the X-ray data from different specimens. The combination of these results with electron microscope and chemical data provides low resolution three- dimensional representations of the structures of gap junctions.


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