A new approach to measure ion reflection and secondary ion emission during ion bombardment of atomically clean and smooth monocrystalline metal surfaces

1970 ◽  
Vol 20 (2) ◽  
pp. 424-428 ◽  
Author(s):  
E.P.Th.M. Suurmeijer ◽  
A.L. Boers ◽  
S.H.A. Begemann
1988 ◽  
Vol 60 (10) ◽  
pp. 948-951 ◽  
Author(s):  
S. Della-Negra ◽  
J. Depauw ◽  
H. Joret ◽  
Y. Le Beyec ◽  
E. A. Schweikert

2004 ◽  
Vol 70 (4) ◽  
Author(s):  
Satoshi Ninomiya ◽  
Chikage Imada ◽  
Masafumi Nagai ◽  
Yoshihiko Nakata ◽  
Nobutsugu Imanishi

Sign in / Sign up

Export Citation Format

Share Document