Holographic inversion of photoelectron diffraction patterns from Cu(001)

1992 ◽  
Vol 264 (3) ◽  
pp. 380-390 ◽  
Author(s):  
A. Stuck ◽  
D. Naumović ◽  
H.A. Aebischer ◽  
T. Greber ◽  
J. Osterwalder ◽  
...  
Keyword(s):  
Photoelectron Diffraction ◽  
Diffraction Patterns

First Experimental Determination of an Adsorption Site Using Multiple Wave Number Photoelectron Diffraction Patterns

1994 ◽  
Vol 73 (26) ◽  
pp. 3548-3551 ◽  
Author(s):  
M. Zharnikov ◽  
M. Weinelt ◽  
P. Zebisch ◽  
M. Stichler ◽  
H. -P. Steinrück
Keyword(s):  
Experimental Determination ◽  
Adsorption Site ◽  
Wave Number ◽  
Multiple Wave ◽  
Photoelectron Diffraction ◽  
Diffraction Patterns

Holographic reconstruction of Pt(110) using multiple wave number photoelectron diffraction patterns

1994 ◽  
Vol 312 (1-2) ◽  
pp. 82-96 ◽  
Author(s):  
M. Zharnikov ◽  
D. Mehl ◽  
M. Weinelt ◽  
P. Zebisch ◽  
H.-P. Steinrück
Keyword(s):  
Wave Number ◽  
Multiple Wave ◽  
Photoelectron Diffraction ◽  
Diffraction Patterns ◽  
Holographic Reconstruction

Magnetism-induced symmetry breaking in photoelectron diffraction patterns

2005 ◽  
Vol 71 (1) ◽  
Author(s):  
A. Chassé ◽  
W. Kuch ◽  
M. Kotsugi ◽  
Xingyu Gao ◽  
F. Offi ◽  
...  
Keyword(s):  
Symmetry Breaking ◽  
Photoelectron Diffraction ◽  
Diffraction Patterns

Holography of clean and sulphur-covered Ni(111) using multiple wave number photoelectron diffraction patterns

1995 ◽  
Vol 334 (1-3) ◽  
pp. 114-134 ◽  
Author(s):  
M. Zharnikov ◽  
M. Weinelt ◽  
P. Zebisch ◽  
M. Stichler ◽  
H.-P. Steinrück
Keyword(s):  
Wave Number ◽  
Multiple Wave ◽  
Photoelectron Diffraction ◽  
Diffraction Patterns

Elastic and inelastic contributions to the XPS photoelectron diffraction patterns of Ni(100) and NiO(100)

1993 ◽  
Vol 291 (1-2) ◽  
pp. 154-166 ◽  
Author(s):  
P. Steiner ◽  
Th. Straub ◽  
Fr. Reinert ◽  
R. Zimmermann ◽  
S. Hüfner
Keyword(s):  
Photoelectron Diffraction ◽  
Diffraction Patterns

Two-dimensional photoelectron diffraction patterns by display-type spherical mirror analyzer

1991 ◽  
Vol 242 (1-3) ◽  
pp. 288-293 ◽  
Author(s):  
H. Daimon ◽  
Y. Tezuka ◽  
A. Otaka ◽  
N. Kanada ◽  
S.K. Lee ◽  
...  
Keyword(s):  
Display Type ◽  
Spherical Mirror ◽  
Two Dimensional ◽  
Photoelectron Diffraction ◽  
Diffraction Patterns

THE TRANSITION FROM AMORPHOUS SILICON OXIDE TO CRYSTALLINE SILICON STUDIED BY PHOTOELECTRON DIFFRACTION

2002 ◽  
Vol 09 (02) ◽  
pp. 735-740 ◽  
Author(s):  
C. WESTPHAL ◽  
S. DREINER ◽  
M. SCHÜRMANN ◽  
H. ZACHARIAS
Keyword(s):  
Least Squares ◽  
Amorphous Silicon ◽  
Silicon Oxide ◽  
Crystalline Silicon ◽  
Sharp Interface ◽  
Oxidation States ◽  
Photoelectron Diffraction ◽  
Least Squares Fitting ◽  
Amorphous Silicon Oxide ◽  
Diffraction Patterns

Angle-scanned photoelectron diffraction patterns of the Si 2p signal of oxidized Si(111) and Si(001) surfaces have been recorded and compared with simulations. The chemically shifted components of the Si 2p signal were deconvoluted by least squares fitting. The different oxidation states exhibit individual diffraction patterns for both surface orientations, indicating a different environment for each suboxide. For the Si(111) surface the results agree with a previously proposed sharp interface, whereas a graded interface is indicated for the Si(001) surface.

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