1117. Investigation of neutral particles generated at action of laser radiation on solid target

Vacuum ◽  
1975 ◽  
Vol 25 (8) ◽  
pp. 391
Keyword(s):  
Laser Radiation ◽  
Solid Target ◽  
Neutral Particles

Optimal focusing of laser radiation on the surface of a solid target

1975 ◽  
Vol 5 (7) ◽  
pp. 871-872 ◽  
Author(s):  
Konstantin N Koshelev ◽  
Sergei V Chekalin ◽  
S S Churilov
Keyword(s):  
Laser Radiation ◽  
Solid Target ◽  
Optimal Focusing

Generation of deuterium-tritium neutrons by spherical heating of a solid target with high-power laser radiation

1975 ◽  
Vol 4 (9) ◽  
pp. 1154-1155 ◽  
Author(s):  
N G Basov ◽  
Yu A Zakharenkov ◽  
Oleg N Krokhin ◽  
Yu A Mikhailov ◽  
G V Sklizkov ◽  
...  
Keyword(s):  
Laser Radiation ◽  
High Power ◽  
Solid Target ◽  
High Power Laser ◽  
Power Laser ◽  
High Power Laser Radiation

Generation of high-energy negative hydrogen ions upon the interaction of superintense femtosecond laser radiation with a solid target

JETP Letters ◽  
2002 ◽  
Vol 76 (3) ◽  
pp. 139-142 ◽  
Author(s):  
R. V. Volkov ◽  
V. M. Gordienko ◽  
I. M. Lachko ◽  
P. M. Mikheev ◽  
B. V. Mar'in ◽  
...  
Keyword(s):  
Laser Radiation ◽  
Femtosecond Laser ◽  
High Energy ◽  
Solid Target ◽  
Hydrogen Ions ◽  
Femtosecond Laser Radiation

A mass-spectrometric study of atomic and molecular ions produced by laser radiation on a solid target

1985 ◽  
Vol 64 (3) ◽  
pp. 255-264 ◽  
Author(s):  
G.M. Arzumanian ◽  
D.D. Bogdanov ◽  
Yu.A. Bykowsky ◽  
A.M. Rodin ◽  
S.M. Silnov ◽  
...  
Keyword(s):  
Laser Radiation ◽  
Mass Spectrometric Study ◽  
Molecular Ions ◽  
Mass Spectrometric ◽  
Solid Target ◽  
Spectrometric Study

First H+ Charge-Exchange Images in the Stim.

1976 ◽  
Vol 34 ◽  
pp. 504-505
Author(s):  
Wm. H. Escovitz ◽  
T. R. Fox ◽  
R. Levi-Setti
Keyword(s):  
Charge Exchange ◽  
Neutral Component ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Neutral Particles ◽  
Charged Beam ◽  
Scanning Transmission ◽  
Contrast Mechanism ◽  
Ion Microscopy ◽  
Beam Component

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.

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