An investigation of the possible interaction mechanisms for Si(Li) and Ge detector response functions by Monte Carlo simulation

Author(s):  
R.P. Gardner ◽  
A.M. Yacout ◽  
J. Zhang ◽  
K. Verghese
2002 ◽  
Vol 57 (4) ◽  
pp. 517-524 ◽  
Author(s):  
Hu-Xia Shi ◽  
Bo-Xian Chen ◽  
Ti-Zhu Li ◽  
Di Yun

2018 ◽  
Vol 63 (19) ◽  
pp. 195002 ◽  
Author(s):  
Björn Delfs ◽  
Daniela Poppinga ◽  
Ann-Britt Ulrichs ◽  
Ralf-Peter Kapsch ◽  
Dietrich Harder ◽  
...  

2003 ◽  
Vol 25 (2) ◽  
pp. 35-42 ◽  
Author(s):  
E. P. Tsaousoglou ◽  
S. D. Bolis ◽  
C. E. Efstathiou

The precision characteristics of the absorbance measurements obtained with a low-cost miniature spectrometer incorporating an array detector were evaluated. Uncertainties in absorbance measurements were due to a combination of non-uniform light intensity and detector response over the wavelength range examined (350-850 nm), in conjunction with the digitization of the intensity indications and the intrinsic noise of the detecting elements. The precision characteristics are presented as contour plots displaying the expected RSD% of absorbances on the absorbance versus wavelength plane. The minimum RSD% for the spectrometer configuration tested was observed within the 0.2-1.5 absorbance units and 500-750 nm wavelength range. Without invoking signal enhancement features of the data-acquisition program (scan average, higher integration times, smoothing based on averaging the signal detected by adjacent pixels), the attainable precision within this range was 0.4-0.8%. A computer program based on Monte Carlo simulations was developed for the prediction of absorbance precision characteristics under various conditions of measurements.


Sign in / Sign up

Export Citation Format

Share Document