Reliability estimation of an system with non-identical component strengths: the Weibull case

1992 ◽  
Vol 36 (2) ◽  
pp. 109-116 ◽  
Author(s):  
M. Pandey ◽  
Md.Borhan Uddin ◽  
Jannatul Ferdous
Methodology ◽  
2012 ◽  
Vol 8 (2) ◽  
pp. 71-80 ◽  
Author(s):  
Juan Botella ◽  
Manuel Suero

In Reliability Generalization (RG) meta-analyses, the importance of bearing in mind the problems of range restriction or biased sampling and their influence on reliability estimation has often been highlighted. Nevertheless, the presence of heterogeneous variances in the included studies has been diagnosed in a subjective way and has not been taken into account in later analyses. Procedures to detect the presence of a variety of sampling schemes and to manage them in the analyses are proposed. The procedures are further explained with an example, by applying them to 25 estimates of Cronbach’s alpha coefficient in the Hamilton Scale for Depression.


AIAA Journal ◽  
1998 ◽  
Vol 36 ◽  
pp. 1509-1515 ◽  
Author(s):  
Gerhard S. Szekely ◽  
Christoph E. Brenner ◽  
Helmut J. Pradlwarter ◽  
Gerhart I. Schueller ◽  
Wolfgang H. Teichert ◽  
...  

2017 ◽  
Vol 73 (5) ◽  
Author(s):  
G. Krishna Mohan ◽  
R. Satyaprasad ◽  
N. V. K. Stanley Raju

2019 ◽  
pp. 57-63
Author(s):  
M. A. Artyukhova ◽  
S. N. Polesskiy

Human activity is often accompanied by exposure of ionizing radiation: the exploitation of space systems and power plants, research using isotopic sources, medicine. The development of electronic equipment is regulated by carrying out activities to ensure the required reliability and radiation resistance. However, the effect of ionizing radiation on reliability indicators is not taken into account properly, or is not taken into account at all, that sometimes leads to the loss of expensive equipment and even to human victims. The article discusses the methodology for carrying out an adequate estimate of the reliability considering the influence of external influencing factors, including ionizing radiation. The timeliness of decisions making to ensure the required reliability indicators is determined by the completeness of the reliability estimation at the design stage. Effort to ensure the reliability and durability of devices after the design stage is not economically viable. The completeness and adequacy of the estimation always depends on the interaction of specialists in different fields: designers, programmers, experts in the field of circuit design, electrical engineering and experts in the field of reliability and radiation resistance.


Author(s):  
Shinichi Ogawa ◽  
Toshiyuki Ohdaira ◽  
Nobuki Hosoi ◽  
Nobuaki Tarumi ◽  
Ryoichi Suzuki ◽  
...  

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