Mid-infrared gas-sensing systems and applications

Author(s):  
Armin Lambrecht ◽  
Katrin Schmitt
Author(s):  
Jurgen Hildenbrand ◽  
Andreas Kurzinger ◽  
Carolin Peter ◽  
Emmanuel Moretton ◽  
Jurgen Wollenstein ◽  
...  

2010 ◽  
Vol 10 (2) ◽  
pp. 353-362 ◽  
Author(s):  
JÜrgen Hildenbrand ◽  
Jan Korvink ◽  
JÜrgen Wollenstein ◽  
Carolin Peter ◽  
Andreas Kurzinger ◽  
...  

2009 ◽  
Author(s):  
J. Hildenbrand ◽  
C. Peter ◽  
F. Lamprecht ◽  
A. Kürzinger ◽  
F. Naumann ◽  
...  

Nanophotonics ◽  
2014 ◽  
Vol 3 (4-5) ◽  
pp. 329-341 ◽  
Author(s):  
Raji Shankar ◽  
Marko Lončar

AbstractThe mid-infrared (IR) wavelength region (2–20 µm) is of great interest for a number of applications, including trace gas sensing, thermal imaging, and free-space communications. Recently, there has been significant progress in developing a mid-IR photonics platform in Si, which is highly transparent in the mid-IR, due to the ease of fabrication and CMOS compatibility provided by the Si platform. Here, we discuss our group’s recent contributions to the field of silicon-based mid-IR photonics, including photonic crystal cavities in a Si membrane platform and grating-coupled high-quality factor ring resonators in a silicon-on-sapphire (SOS) platform. Since experimental characterization of microphotonic devices is especially challenging at the mid-IR, we also review our mid-IR characterization techniques in some detail. Additionally, pre- and post-processing techniques for improving device performance, such as resist reflow, Piranha clean/HF dip cycling, and annealing are discussed.


Author(s):  
J. A. Gupta ◽  
P. J. Barrios ◽  
A. Bezinger ◽  
P. Waldron ◽  
B. F. Ventrudo ◽  
...  

2018 ◽  
Vol 112 (16) ◽  
pp. 161107 ◽  
Author(s):  
F. Rothmayr ◽  
A. Pfenning ◽  
C. Kistner ◽  
J. Koeth ◽  
G. Knebl ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document