Quantitative nondestructive evaluation, of a surface crack by a remote magneto-optical inspection system

Nondestructive Characterization of Materials X ◽

10.1016/b978-008043799-6/50042-2 ◽

2001 ◽

pp. 327-332

Author(s):

Jinyi Lee ◽

Hiroshi Kato ◽

Tetsuo Shoji ◽

Dorian Minkov

Keyword(s):

Nondestructive Evaluation ◽

Surface Crack ◽

Inspection System ◽

Optical Inspection ◽

Optical Inspection System

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Automated optical inspection system for surface mount device light emitting diodes

Journal of Intelligent Manufacturing ◽

10.1007/s10845-016-1270-6 ◽

2016 ◽

Vol 30 (2) ◽

pp. 641-655 ◽

Author(s):

Chung-Feng Jeffrey Kuo ◽

Tz-ying Fang ◽

Chi-Lung Lee ◽

Han-Cheng Wu

Keyword(s):

Light Emitting Diodes ◽

Inspection System ◽

Light Emitting ◽

Surface Mount ◽

Optical Inspection ◽

Automated Optical Inspection ◽

Optical Inspection System

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Development of optical inspection system for detecting malfunctions of digital micromirror device

10.1117/12.2075175 ◽

2015 ◽

Author(s):

Minwook Kang ◽

Dong Won Kang ◽

Wondong Lee ◽

Jae W. Hahn

Keyword(s):

Inspection System ◽

Digital Micromirror Device ◽

Optical Inspection ◽

Optical Inspection System

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Algorithms for a Fast Confocal Optical Inspection System

Image Technology ◽

10.1007/978-3-642-58288-2_17 ◽

1996 ◽

pp. 439-474

Author(s):

A. R. Rao ◽

N. Ramesh ◽

F. Y. Wu ◽

J. R. Mandeville ◽

P. Kerstens

Keyword(s):

Inspection System ◽

Optical Inspection ◽

Optical Inspection System

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The Deficiency Recognition in PCBA`s Automatic Optical Inspection System by Using Back-Propagation Network Method

Journal of Applied Sciences ◽

10.3923/jas.2008.2814.2824 ◽

2008 ◽

Vol 8 (16) ◽

pp. 2814-2824 ◽

Author(s):

Min-Chie Chiu ◽

Long-Jyi Yeh ◽

Che-Jung Hsu

Keyword(s):

Back Propagation ◽

Inspection System ◽

Automatic Optical Inspection ◽

Optical Inspection ◽

Network Method ◽

Propagation Network ◽

Optical Inspection System

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Advanced automated optical inspection system for fishtail collapse of microrouter

Nondestructive Testing And Evaluation ◽

10.1080/10589750802200756 ◽

2008 ◽

Vol 23 (4) ◽

pp. 257-272 ◽

Author(s):

Der-Baau Perng ◽

Yen-Chung Chen

Keyword(s):

Inspection System ◽

Optical Inspection ◽

Automated Optical Inspection ◽

Optical Inspection System

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Development of super-resolution optical inspection system for semiconductor defects using standing wave illumination shift

10.1117/12.690582 ◽

2006 ◽

Author(s):

S. Usuki ◽

H. Nishioka ◽

S. Takahashi ◽

K. Takamasu

Keyword(s):

Standing Wave ◽

Super Resolution ◽

Inspection System ◽

Semiconductor Defects ◽

Optical Inspection ◽

Optical Inspection System

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Effects of angle of probe laser and pinhole diameter on the time-resolved optical inspection system

Optik ◽

10.1016/j.ijleo.2010.09.045 ◽

2011 ◽

Vol 122 (20) ◽

pp. 1799-1803 ◽

Author(s):

Chil-Chyuan Kuo

Keyword(s):

Probe Laser ◽

Inspection System ◽

Time Resolved ◽

Optical Inspection ◽

Optical Inspection System

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Novel Stent Optical Inspection System

Imaging and Applied Optics 2016 ◽

10.1364/aio.2016.aith2b.3 ◽

2016 ◽

Author(s):

Carlos Bermudez ◽

Ferran Laguarta ◽

Cristina Cadevall ◽

Aitor Matilla ◽

Sergi Ibañez ◽

...

Keyword(s):

Inspection System ◽

Optical Inspection ◽

Optical Inspection System

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New compact, portable automated optical inspection system

Circuit World ◽

10.1108/cw.1999.21725aad.004 ◽

1999 ◽

Vol 25 (1) ◽

Keyword(s):

Inspection System ◽

Optical Inspection ◽

Automated Optical Inspection ◽

Optical Inspection System

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Algorithms for a fast confocal optical inspection system

[1992] Proceedings IEEE Workshop on Applications of Computer Vision ◽

10.1109/acv.1992.240299 ◽

2003 ◽

Author(s):

A.R. Rao ◽

N. Ramesh ◽

F.Y. Wu ◽

J.R. Mandeville ◽

P.J.M. Kerstens

Keyword(s):

Inspection System ◽

Optical Inspection ◽

Optical Inspection System

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