semiconductor defects
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scholarly journals Роль кулоновского взаимодействия в дефектной модели барьера Шоттки

2021 ◽  
Vol 47 (5) ◽  
pp. 28
Author(s):  
С.Ю. Давыдов ◽  
О.В. Посредник
Keyword(s):  
Schottky Barrier ◽  
Barrier Height ◽  
Short Range ◽  
Schottky Barrier Height ◽  
Coulomb Repulsion ◽  
Semiconductor Defects ◽  
Metal Atoms ◽  
Occupation Numbers ◽  
Analytical Expressions ◽  
Barrier Model

Schottky barrier model is proposed which is characterized by the interface di-mers consist of semiconductor defects and nearest neighboring metal atoms. Short-range Coulomb repulsion between defects and metal atoms electrons is taken into account. Analytical expressions for the occupation for the atoms and defects occupation numbers and Schottky barrier height are obtained.

Superconducting one-dimensional photonic crystal with coupled semiconductor defects

Optik ◽  
2020 ◽  
Vol 209 ◽  
pp. 164572 ◽  
Author(s):  
Francis Segovia-Chaves ◽  
Herbert Vinck-Posada ◽  
Edgar A. Gómez
Keyword(s):  
Photonic Crystal ◽  
One Dimensional ◽  
Dimensional Photonic Crystal ◽  
Semiconductor Defects ◽  
Coupled Semiconductor

Stability and degradation of AlGaN-based UV-B LEDs: Role of doping and semiconductor defects

2019 ◽  
Vol 100-101 ◽  
pp. 113418 ◽  
Author(s):  
F. Piva ◽  
C. De Santi ◽  
M. Deki ◽  
M. Kushimoto ◽  
H. Amano ◽  
...  
Keyword(s):  
Semiconductor Defects

Principle of proximity: Plasmonic hot electrons motivate donator-adjacent semiconductor defects with enhanced electrocatalytic hydrogen evolution

Nano Energy ◽  
2019 ◽  
Vol 60 ◽  
pp. 689-700 ◽  
Author(s):  
Bang Lin Li ◽  
Hao Lin Zou ◽  
Jie Kang Tian ◽  
Guo Chen ◽  
Xiao Hu Wang ◽  
...  
Keyword(s):  
Hydrogen Evolution ◽  
Hot Electrons ◽  
Semiconductor Defects

Engineering two-dimensional electronics by semiconductor defects

Nano Today ◽  
2017 ◽  
Vol 16 ◽  
pp. 30-45 ◽  
Author(s):  
Dan Wang ◽  
Xian-Bin Li ◽  
Dong Han ◽  
Wei Quan Tian ◽  
Hong-Bo Sun
Keyword(s):  
Two Dimensional ◽  
Semiconductor Defects

Evolutionary Fuzzy ARTMAP Neural Networks for Classification of Semiconductor Defects

2015 ◽  
Vol 26 (5) ◽  
pp. 933-950 ◽  
Author(s):  
Shing Chiang Tan ◽  
Junzo Watada ◽  
Zuwairie Ibrahim ◽  
Marzuki Khalid
Keyword(s):  
Neural Networks ◽  
Fuzzy Artmap ◽  
Semiconductor Defects
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