[1992] Proceedings IEEE Workshop on Applications of Computer Vision
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37

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Published By IEEE Comput. Soc. Press

0818628405

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Autonomous landing of airplanes by dynamic machine vision

[1992] Proceedings IEEE Workshop on Applications of Computer Vision ◽

10.1109/acv.1992.240314 ◽

2003 ◽

Author(s):

E.D. Dickmanns ◽

F.-R. Schell

Keyword(s):

Machine Vision ◽

Autonomous Landing

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Scale-space clustering and classification of SAR images with numerous attributes and classes

[1992] Proceedings IEEE Workshop on Applications of Computer Vision ◽

10.1109/acv.1992.240325 ◽

2003 ◽

Author(s):

Y. Wong ◽

E.C. Posner

Keyword(s):

Scale Space ◽

Clustering And Classification

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PROMAP-a system for analysis of topographic maps

[1992] Proceedings IEEE Workshop on Applications of Computer Vision ◽

10.1109/acv.1992.240328 ◽

2003 ◽

Author(s):

B. Lauterbach ◽

N. Ebi ◽

P. Besslich

Keyword(s):

Topographic Maps

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Algorithms for a fast confocal optical inspection system

[1992] Proceedings IEEE Workshop on Applications of Computer Vision ◽

10.1109/acv.1992.240299 ◽

2003 ◽

Author(s):

A.R. Rao ◽

N. Ramesh ◽

F.Y. Wu ◽

J.R. Mandeville ◽

P.J.M. Kerstens

Keyword(s):

Inspection System ◽

Optical Inspection ◽

Optical Inspection System

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Curve recognition using B-spline representation

[1992] Proceedings IEEE Workshop on Applications of Computer Vision ◽

10.1109/acv.1992.240308 ◽

2003 ◽

Author(s):

F.S. Cohen ◽

Z. Huang ◽

Z. Yang

Keyword(s):

B Spline ◽

Spline Representation

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The RegiStar Machine: from conception to installation

[1992] Proceedings IEEE Workshop on Applications of Computer Vision ◽

10.1109/acv.1992.240307 ◽

2003 ◽

Author(s):

G. Medioni ◽

A. Huertas ◽

M. Wilson

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Multiple object tracking system with three level continuous processes

[1992] Proceedings IEEE Workshop on Applications of Computer Vision ◽

10.1109/acv.1992.240331 ◽

2003 ◽

Author(s):

K. Fukui ◽

H. Nakai ◽

Y. Kuno

Keyword(s):

Object Tracking ◽

Tracking System ◽

Multiple Object Tracking ◽

Continuous Processes ◽

Multiple Object

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A vision system for inspection of ball bonds in integrated circuits

[1992] Proceedings IEEE Workshop on Applications of Computer Vision ◽

10.1109/acv.1992.240300 ◽

2003 ◽

Author(s):

A. Khotanzad ◽

H. Banerjee ◽

M. Srinath

Keyword(s):

Integrated Circuits ◽

Vision System ◽

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Automated direct patterned wafer inspection

[1992] Proceedings IEEE Workshop on Applications of Computer Vision ◽

10.1109/acv.1992.240303 ◽

2003 ◽

Author(s):

B.H. Khalaj ◽

H.K. Aghajan ◽

T. Kailath

Keyword(s):

Wafer Inspection

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A segmentation-free approach to OCR

[1992] Proceedings IEEE Workshop on Applications of Computer Vision ◽

10.1109/acv.1992.240312 ◽

2003 ◽

Author(s):

C.H. Chen ◽

J.L. DeCurtins

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