In-situ electron microscopy investigation of reduction-induced microstructural changes in NiO

2015 ◽  
Vol 41 (10) ◽  
pp. 12658-12667 ◽  
Author(s):  
Joysurya Basu ◽  
R. Divakar
ACS Nano ◽  
2019 ◽  
Vol 13 (8) ◽  
pp. 9421-9430 ◽  
Author(s):  
Xiuzhen Wang ◽  
Zhenpeng Yao ◽  
Sooyeon Hwang ◽  
Ying Pan ◽  
Hui Dong ◽  
...  

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