The wettability of silicon surface hydrophobized using silanization reagents was studied. The advancing and receding contact angles were measured with the captive needle approach. In this approach, a drop under study was held on the hydrophobized surface with a fine needle immersed in it. The asymptotic advancing and receding angles were obtained by incrementally increasing the volume added and removed, respectively, until no change in angles was observed. The values were compared with the previously published results. Further, the wetting behavior of water droplets on periodically structured hydrophobic surfaces was investigated. The surfaces were prepared with the wet etching process and contain posts and holes of different sizes and void fractions. The surface geometry brought up a scope to study the Wenzel (filling of surface grooves) and Cassie (non filling of the surface grooves) theories and effects of surface geometry and roughness on the contact angle. Experimental data point to an anomalous behavior where the data does not obey either Wenzel or Cassie type phenomenology. This behavior is explained by an understanding of the contact line topography. The effect of contact line topography on the contact angle was thus parametrically studied. It was also inferred that, the contact angle increased with the increase in void fraction. The observations may serve as guidelines in designing surfaces with the desired wetting behavior.
