Fluorescence enhancement of coumarin–quinoline by transition metal ions: Detection of paramagnetic Ni2+ and Co2+

2009 ◽  
Vol 83 (1) ◽  
pp. 14-20 ◽  
Author(s):  
Weiying Lin ◽  
Lin Yuan ◽  
Zengmei Cao ◽  
Jianbo Feng ◽  
Yanming Feng
2006 ◽  
Vol 19 (6) ◽  
pp. 506-510 ◽  
Author(s):  
Guo-tao Wen ◽  
Man-zhou Zhu ◽  
Zhuo Wang ◽  
Xiang-ming Meng ◽  
Hui-yuan Hu ◽  
...  

Nanoscale ◽  
2018 ◽  
Vol 10 (16) ◽  
pp. 7526-7535 ◽  
Author(s):  
Jiazhi Duan ◽  
Baojin Ma ◽  
Feng Liu ◽  
Shan Zhang ◽  
Shicai Wang ◽  
...  

Tb-Asp fluorescent nanocrystals have been applied in metal ions detection due to the different coordination ability of different transition metal ions with Asp molecules in Tb-Asp nanocrystals.


ChemInform ◽  
2014 ◽  
Vol 45 (44) ◽  
pp. no-no
Author(s):  
Sanchari Pal ◽  
Nabanita Chatterjee ◽  
Parimal K. Bharadwaj

RSC Advances ◽  
2014 ◽  
Vol 4 (51) ◽  
pp. 26585-26620 ◽  
Author(s):  
Sanchari Pal ◽  
Nabanita Chatterjee ◽  
Parimal K. Bharadwaj

Fluorescence signaling systems that give enhancement in the presence of first-row transition metal ions are discussed.


Author(s):  
R. Ai ◽  
H.-J. Fan ◽  
L. D. Marks

It has been known for a long time that electron irradiation induces damage in maximal valence transition metal oxides such as TiO2, V2O5, and WO3, of which transition metal ions have an empty d-shell. This type of damage is excited by electronic transition and can be explained by the Knoteck-Feibelman mechanism (K-F mechanism). Although the K-F mechanism predicts that no damage should occur in transition metal oxides of which the transition metal ions have a partially filled d-shell, namely submaximal valence transition metal oxides, our recent study on ReO3 shows that submaximal valence transition metal oxides undergo damage during electron irradiation.ReO3 has a nearly cubic structure and contains a single unit in its cell: a = 3.73 Å, and α = 89°34'. TEM specimens were prepared by depositing dry powders onto a holey carbon film supported on a copper grid. Specimens were examined in Hitachi H-9000 and UHV H-9000 electron microscopes both operated at 300 keV accelerating voltage. The electron beam flux was maintained at about 10 A/cm2 during the observation.


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