scholarly journals Normal spectral emissivity measurement of graphite in the temperature range between 200°C and 500°C

2022 ◽  
Vol 175 ◽  
pp. 112998
Author(s):  
Yuzhong Zhang ◽  
Fucheng Lu ◽  
Tao Deng ◽  
Shuangbao Shu ◽  
Yan Zhang ◽  
...  
Keyword(s):  
Spectral Emissivity ◽  
Normal Spectral Emissivity ◽  
Temperature Range ◽  
Emissivity Measurement

Normal spectral emissivity measurement of Al6061 in air environment

2015 ◽  
Author(s):  
Feng Zhang ◽  
Kun Yu ◽  
Kaihua Zhang ◽  
Yanlei Liu ◽  
Kaipin Xu ◽  
...  
Keyword(s):  
Spectral Emissivity ◽  
Normal Spectral Emissivity ◽  
Emissivity Measurement

Enhanced Infrared Normal Spectral Emissivity of Microstructured Silicon at 100 to 200°C

2011 ◽  
Vol 295-297 ◽  
pp. 886-889
Author(s):  
Guo Jin Feng ◽  
Yu Wang ◽  
Yuan Li ◽  
Ting Ting Guo
Keyword(s):  
Femtosecond Laser ◽  
Wavelength Range ◽  
Spectral Emissivity ◽  
Normal Spectral Emissivity ◽  
Temperature Range ◽  
Blackbody Source ◽  
Temperature Ranges ◽  
Silicon Based ◽  
Middle Infrared ◽  
Entire Wavelength Range

The infrared normal spectral emissivity of microstructured silicon prepared by femtosecond laser was measured for the middle infrared waveband at temperature range 100 to 200°C. Compared to that of flat silicon, emissivity was enhanced over the entire wavelength range. For a sample with different spike height, the minimum emissivity at a temperature of 100°C is more than 0.6. Although the average emissivity is less than Nextel- Velvet-811-21 Coating , it can be used stably at more wide temperature ranges. These results show the potential for microstructured silicon to be used as a flat blackbody source or silicon-based devices.

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