State of the art: Dynamic symbolic execution for automated test generation

Ting Chen; Xiao-song Zhang; Shi-ze Guo; Hong-yuan Li; Yue Wu

doi:10.1016/j.future.2012.02.006

State of the art: Dynamic symbolic execution for automated test generation

Future Generation Computer Systems ◽

10.1016/j.future.2012.02.006 ◽

2013 ◽

Vol 29 (7) ◽

pp. 1758-1773 ◽

Cited By ~ 34

Author(s):

Ting Chen ◽

Xiao-song Zhang ◽

Shi-ze Guo ◽

Hong-yuan Li ◽

Yue Wu

Keyword(s):

Test Generation ◽

State Of The Art ◽

Symbolic Execution ◽

Automated Test Generation ◽

Automated Test ◽

Dynamic Symbolic Execution

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Automated test generation for IEC 61131-3 ST programs via dynamic symbolic execution

Science of Computer Programming ◽

10.1016/j.scico.2021.102608 ◽

2021 ◽

Vol 206 ◽

pp. 102608

Author(s):

Weigang He ◽

Jianqi Shi ◽

Ting Su ◽

Zeyu Lu ◽

Li Hao ◽

...

Keyword(s):

Test Generation ◽

Symbolic Execution ◽

Automated Test Generation ◽

Automated Test ◽

Dynamic Symbolic Execution

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Automated Test Generation for IEC 61131-3 ST Programs via Dynamic Symbolic Execution

2019 International Symposium on Theoretical Aspects of Software Engineering (TASE) ◽

10.1109/tase.2019.00004 ◽

2019 ◽

Author(s):

Li Hao ◽

Jianqi Shi ◽

Ting Su ◽

Yanhong Huang

Keyword(s):

Test Generation ◽

Symbolic Execution ◽

Automated Test Generation ◽

Automated Test ◽

Dynamic Symbolic Execution

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Automated test generation on path-based symbolic execution

2014 IEEE 5th International Conference on Software Engineering and Service Science ◽

10.1109/icsess.2014.6933698 ◽

2014 ◽

Author(s):

Zhang Min ◽

Fu Min

Keyword(s):

Test Generation ◽

Symbolic Execution ◽

Automated Test Generation ◽

Automated Test

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Automated test generation for OpenCL kernels using fuzzing and constraint solving

Proceedings of the 13th Annual Workshop on General Purpose Processing using Graphics Processing Unit ◽

10.1145/3366428.3380768 ◽

2020 ◽

Author(s):

Chao Peng ◽

Ajitha Rajan

Keyword(s):

Test Generation ◽

Constraint Solving ◽

Automated Test Generation ◽

Automated Test

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The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6527-4_5 ◽

2002 ◽

pp. 71-90 ◽

Cited By ~ 3

Author(s):

Erik Jan Marinissen

Keyword(s):

Test Generation ◽

Automated Test Generation ◽

Automated Test

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Automated Test Generation and Verified Software

Verified Software: Theories, Tools, Experiments - Lecture Notes in Computer Science ◽

10.1007/978-3-540-69149-5_18 ◽

2008 ◽

pp. 161-172 ◽

Cited By ~ 14

Author(s):

John Rushby

Keyword(s):

Test Generation ◽

Automated Test Generation ◽

Automated Test ◽

Verified Software

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Data driven architecture based automated test generation for Android mobile

2015 IEEE International Conference on Computational Intelligence and Computing Research (ICCIC) ◽

10.1109/iccic.2015.7435772 ◽

2015 ◽

Cited By ~ 4

Author(s):

R Anbunathan ◽

Anirban Basu

Keyword(s):

Test Generation ◽

Data Driven ◽

Automated Test Generation ◽

Automated Test

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Visual Requirements Specification and Automated Test Generation for Digital Applications

2015 IEEE/ACM 2nd International Workshop on Requirements Engineering and Testing ◽

10.1109/ret.2015.15 ◽

2015 ◽

Cited By ~ 1

Author(s):

Kapil Singi ◽

Vikrant Kaulgud ◽

Dipin Era

Keyword(s):

Test Generation ◽

Requirements Specification ◽

Automated Test Generation ◽

Automated Test

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DirectFuzz: Automated Test Generation for RTL Designs using Directed Graybox Fuzzing

10.1109/dac18074.2021.9586289 ◽

2021 ◽

Author(s):

Sadullah Canakci ◽

Leila Delshadtehrani ◽

Furkan Eris ◽

Michael Bedford Taylor ◽

Manuel Egele ◽

...

Keyword(s):

Test Generation ◽

Automated Test Generation ◽

Automated Test

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Automated Test Generation for Debugging Arithmetic Circuits

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) ◽

10.3850/9783981537079_0823 ◽

2016 ◽

Cited By ~ 7

Author(s):

Farimah Farahmandi ◽

Prabhat Mishra

Keyword(s):

Test Generation ◽

Arithmetic Circuits ◽

Automated Test Generation ◽

Automated Test

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