scholarly journals Evaluation of fracture mechanics parameters for free edges in multi-layered structures with weak singularities

2009 ◽  
Vol 46 (5) ◽  
pp. 1134-1148 ◽  
Author(s):  
L.Y. Shang ◽  
Z.L. Zhang ◽  
B. Skallerud
Keyword(s):  
Fracture Mechanics ◽  
Layered Structures ◽  
Weak Singularities ◽  
Free Edges

Effect of high pressure-temperature on silicon layered structures as determined by X-ray diffraction and electron microscopy

2004 ◽  
Vol 27 (1-3) ◽  
pp. 415-418
Author(s):  
J. Bak-Misiuk ◽  
A. Misiuk ◽  
J. Ratajczak ◽  
A. Shalimov ◽  
I. Antonova ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Pressure ◽  
Layered Structures ◽  
X Ray Diffraction ◽  
X Ray
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